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    Impact of Tensile and Compressive Stress on Classical and Acoustic Barkhausen Effects in Grain-Oriented Electrical Steel 

    Type: Journal Paper
    Author : Augustyniak, Boleslaw; Piotrowski, Leszek; Jasnoch, Paulina; Chmielewski, Marek
    Publisher: IEEE
    Year: 2014

    Determining Residual Stress Depth Profiles Using the Magnetic Barkhausen Effect 

    Type: Journal Paper
    Author : Mierczak, Lukasz P.; Melikhov, Yevgen; Jiles, David C.
    Publisher: IEEE
    Year: 2014

    [Front cover] 

    Type: Conference Paper
    Publisher: IEEE
    Year: 2014

    Effect of <inline-formula> <img src="/images/tex/21840.gif" alt="(\\alpha )"> </inline-formula>-Particle Irradiation on the Magnetic Properties of Ni Nanowires 

    Type: Journal Paper
    Author : Singh, A.K.; Das, Biswajit; Sen, Pintu; Bandopadhyay, Sujit Kumar; Mandal, Kalyan
    Publisher: IEEE
    Year: 2014

    Sharp Increase of Hysteresis Area Due to Small Plastic Deformation Studied With Magnetic Barkhausen Noise 

    Type: Journal Paper
    Author : de C Antonio, Pedro P.; de Campos, Marcos F.; da S Dias, Fabio M.; Alberteris Campos, Manuel; Capo-Sanchez, Julio; Padovese, Linilson R.
    Publisher: IEEE
    Year: 2014

    Residual Stress Analysis in Nonoriented Electrical Steel Sheets by Barkhausen Noise Measurements 

    Type: Journal Paper
    Author : Vourna, Polyxeni; Ktena, Aphrodite; Hristoforou, Evangelos
    Publisher: IEEE
    Year: 2014

    Low driving voltage (&lt; 400mV<inf>pp</inf>) electro-absorption modulator laterally integrated with VCSEL 

    Type: Conference Paper
    Author : Dalir, H. , Takahashi, Y. , Koyama, F.
    Publisher: IEEE
    Year: 2014

    Analysis of Barkhausen Noise Emissions and Magnetic Hysteresis in Multi-Phase Magnetic Materials 

    Type: Journal Paper
    Author : Gaunkar, Neelam Prabhu; Kypris, Orfeas; Nlebedim, Ikenna Cajetan; Jiles, David C.
    Publisher: IEEE
    Year: 2014

    Alternating Motion of Single-Domain Walls in Uniaxial Magnetic Wire 

    Type: Journal Paper
    Author : Jime&#x0301; nez, Alejandro; Va&#x0301; zquez, Manuel
    Publisher: IEEE
    Year: 2014

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