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Atmospheric Pressure Plasma Jet Array With Multivariate Cells

نوع: Journal Paper

نویسنده : Zheng-Shi Chang; Guan-Jun Zhang; Cong-Wei Yao; Wen-Long Liao; Xing-Min Shi

ناشر: IEEE

سال: 2014

High-performance HfO2/ZrO2/IGZO thin-film transistors deposited using atmospheric pressure plasma jet

نوع: Journal Paper

نویسنده : Chien-Hung Wu; Kow-Ming Chang; Hsin-Yu Hsu

ناشر: IET

سال: 2014

Power “smoothing” of a commercial-size photovoltaic system by an energy storage system

نوع: Conference Paper

نویسنده : Moumouni, Y. , Baghzouz, Y. , Boehm, R.F.

ناشر: IEEE

سال: 2014

Behavior of Atmospheric Pressure Plasma Jet in External Electric Field

نوع: Journal Paper

نویسنده : Lijuan Liu; Yu Zhang; Jiting Ouyang

ناشر: IEEE

سال: 2014

Investigation of LaAlO3/ZrO2/<italic>a</italic>-InGaZnO thin-film transistors using atmospheric pressure plasma jet

نوع: Journal Paper

نویسنده : Chien-Hung Wu; Hau-Yuan Huang; Shui-Jinn Wang; Kow-Ming Chang; Hsin-Yu Hsu

ناشر: IET

سال: 2014

Theoretical vulnerability in likelihood-ratio-based biometric verification

نوع: Conference Paper

نویسنده : Ohki, Tetsushi; Otsuka, Akira

ناشر: IEEE

سال: 2014

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Atmospheric Pressure Plasma Jet Array With Multivariate Cells

High-performance HfO<sub>2</sub>/ZrO<sub>2</sub>/IGZO thin-film transistors deposited using atmospheric pressure plasma jet

Power “smoothing” of a commercial-size photovoltaic system by an energy storage system

Behavior of Atmospheric Pressure Plasma Jet in External Electric Field

Investigation of LaAlO<sub>3</sub>/ZrO<sub>2</sub>/<italic>a</italic>-InGaZnO thin-film transistors using atmospheric pressure plasma jet

Theoretical vulnerability in likelihood-ratio-based biometric verification

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Atmospheric Pressure Plasma Jet Array With Multivariate Cells

High-performance HfO<sub>2</sub>/ZrO<sub>2</sub>/IGZO thin-film transistors deposited using atmospheric pressure plasma jet

Power &#x201C;smoothing&#x201D; of a commercial-size photovoltaic system by an energy storage system

Behavior of Atmospheric Pressure Plasma Jet in External Electric Field

Investigation of LaAlO<sub>3</sub>/ZrO<sub>2</sub>/<italic>a</italic>-InGaZnO thin-film transistors using atmospheric pressure plasma jet

Theoretical vulnerability in likelihood-ratio-based biometric verification

Power “smoothing” of a commercial-size photovoltaic system by an energy storage system