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نمایش تعداد 1-9 از 9
Tackling close-to-band passivity violations in passive macro-modeling
ناشر: IEEE
سال: 2014
Importance Boundary Sampling for SRAM Yield Analysis With Multiple Failure Regions
ناشر: IEEE
سال: 2014
Efficient high-sigma yield analysis for high dimensional problems
ناشر: IEEE
سال: 2014
A systematic design methodology for yield-driven near-threshold SRAM design
ناشر: IEEE
سال: 2014