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RISUnderstanding of self-heating enhanced degradation in pLDMOSFETs by MR-DCIV method
ناشر: IEEE
سال: 2014
An efficient test structure for interface trap characterization under BTI stresses
ناشر: IEEE
سال: 2014
A low-phase-noise and wide-tuning-range LC digital controlled oscillator
ناشر: IEEE
سال: 2014
The beat-frequency circuit for monitoring duty-cycle shift based on BTI effect
ناشر: IEEE
سال: 2014
A comprehensive NBTI degradation model based on ring oscillator circuit
ناشر: IEEE
سال: 2014