Search
نمایش تعداد 1-3 از 3
Review of reliability bounds for consecutive-k-out-of-n systems
ناشر: IEEE
سال: 2014
Reliability enhanced SRAM bit-cells
ناشر: IEEE
سال: 2014
A dual-voltage hybrid NEMS-CMOS low-power scheme
ناشر: IEEE
سال: 2014