Search

نمایش تعداد 1-10 از 38

Effect of an organic buffer layer on the stability of zinc oxide thin film transistors

نوع: Journal Paper

ناشر: American Scientific Publishers

سال: 2014

A one-phase, distribution-level phasor measurement unit for post-event analysis

نوع: Conference Paper

ناشر: IEEE

سال: 2014

PICav: Precise, Iterative, and Complement-Based Cloud Storage Availability Calculation Scheme

نوع: Conference Paper

نویسنده : Spillner, Josef; Muller, Johannes

ناشر: IEEE

سال: 2014

Difference expansion based Reversible Data Hiding for medical images

نوع: Conference Paper

نویسنده : Vinoth, K.C.; Natarajan, V.; Santhosh, M.S.

ناشر: IEEE

سال: 2014

Bias Dependence of Total Ionizing Dose Effects in SiGe-<formula formulatype="inline"> <img src="/images/tex/21594.gif" alt="{{\\rm SiO}_2}/{{\\rm HfO}_2} p"> </formula>MOS FinFETs

نوع: Journal Paper

نویسنده : Guo Xing Duan; Cher Xuan Zhang; En Xia Zhang; Hachtel, Jordan; Fleetwood, D.M.; Schrimpf, R.D.; Reed, R.A.; Alles, Michael L.; Pantelides, Sokrates T.; Bersuker, Gennadi; Young, Chadwin D.

ناشر: IEEE

سال: 2014

Flexible TFT Circuit Analyzer Considering Process Variation, Aging, and Bending Effects

نوع: Journal Paper

نویسنده : En-Hua Ma; Wen-En Wei; Hung-Yi Li; Li, James Chien-Mo; Cheng, I-Chun; Yung-Hui Yeh

ناشر: IEEE

سال: 2014

Gate-Bias Stress Stability of P-Type SnO Thin-Film Transistors Fabricated by RF-Sputtering

نوع: Journal Paper

نویسنده : I-Chung Chiu; I-Chun Cheng

ناشر: IEEE

سال: 2014

nMOS Short Channel Device Characteristics After Soft Oxide Breakdown and Implications for Reliability Projections and Circuits

نوع: Journal Paper

نویسنده : Nicollian, Paul E.; Min Chen; Yang Yang; Chancellor, Cathy /A/.; Reddy, Viswanath K.

ناشر: IEEE

سال: 2014

Physical Origins and Analysis of Negative-Bias Stress Instability Mechanism in Polymer-Based Thin-Film Transistors

نوع: Journal Paper

نویسنده : Jaewook Lee; Jaeman Jang; Hyeongjung Kim; Jiyoul Lee; Bang-Lin Lee; Sung-Jin Choi; Dong Myong Kim; Dae Hwan Kim; Kyung Rok Kim

ناشر: IEEE

سال: 2014

Web 1.0 to Web 3.0 - Evolution of the Web and its various challenges

نوع: Conference Paper

نویسنده : Nath, K. , Dhar, S. , Basishtha, S.

ناشر: IEEE

سال: 2014

Search

Effect of an organic buffer layer on the stability of zinc oxide thin film transistors

A one-phase, distribution-level phasor measurement unit for post-event analysis

PICav: Precise, Iterative, and Complement-Based Cloud Storage Availability Calculation Scheme

Difference expansion based Reversible Data Hiding for medical images

Bias Dependence of Total Ionizing Dose Effects in SiGe-<formula formulatype="inline"> <img src="/images/tex/21594.gif" alt="{{\\rm SiO}_2}/{{\\rm HfO}_2} p"> </formula>MOS FinFETs

Flexible TFT Circuit Analyzer Considering Process Variation, Aging, and Bending Effects

Gate-Bias Stress Stability of P-Type SnO Thin-Film Transistors Fabricated by RF-Sputtering

nMOS Short Channel Device Characteristics After Soft Oxide Breakdown and Implications for Reliability Projections and Circuits

Physical Origins and Analysis of Negative-Bias Stress Instability Mechanism in Polymer-Based Thin-Film Transistors

Web 1.0 to Web 3.0 - Evolution of the Web and its various challenges

نویسنده

ناشر

سال

کلیدواژه

نوع

زبان

نوع محتوا

عنوان ناشر

Search

Filters

Effect of an organic buffer layer on the stability of zinc oxide thin film transistors

A one-phase, distribution-level phasor measurement unit for post-event analysis

PICav: Precise, Iterative, and Complement-Based Cloud Storage Availability Calculation Scheme

Difference expansion based Reversible Data Hiding for medical images

Bias Dependence of Total Ionizing Dose Effects in SiGe-<formula formulatype="inline"> <img src="/images/tex/21594.gif" alt="{{\\rm SiO}_2}/{{\\rm HfO}_2} p"> </formula>MOS FinFETs

Flexible TFT Circuit Analyzer Considering Process Variation, Aging, and Bending Effects

Gate-Bias Stress Stability of P-Type SnO Thin-Film Transistors Fabricated by RF-Sputtering

nMOS Short Channel Device Characteristics After Soft Oxide Breakdown and Implications for Reliability Projections and Circuits

Physical Origins and Analysis of Negative-Bias Stress Instability Mechanism in Polymer-Based Thin-Film Transistors

Web 1.0 to Web 3.0 - Evolution of the Web and its various challenges