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نمایش تعداد 1-10 از 40

Investigation of Electrostatic Integrity of Nanoscale Dual Material Gate Dielectric Pocket Silicon-on-Void (DMGDPSOV) MOSFET for Improved Device Scalability

نوع: Journal Paper

نویسنده : Kumari, Vandana; Saxena, Manoj; Gupta, R.S.; Gupta, Madhu

ناشر: IEEE

سال: 2014

Analysis of Correlated Gate and Drain Random Telegraph Noise in Post-Soft Breakdown TiN/HfLaO/<formula formulatype="inline"> <img src="/images/tex/20585.gif" alt="{\\rm SiO}_{x}"> </formula> nMOSFETs

نوع: Journal Paper

نویسنده : Wenhu Liu; Padovani, A.; Larcher, Luca; Raghavan, N.; Kin Leong Pey

ناشر: IEEE

سال: 2014

Parallel Processing and Intercommunication of Multiple Negotiation Processes in E-Commerce for Optimal Business

نوع: Conference Paper

نویسنده : Hussain, M.J.

ناشر: IEEE

سال: 2014

PUF Interfaces and their Security

نوع: Conference Paper

نویسنده : Van Dijk, M. , Ruhrmair, U.

ناشر: IEEE

سال: 2014

Uniform Selection of Vertices for Watermark Embedding in 3-D Polygon Mesh Using IEEE754 Floating Point Representation

نوع: Conference Paper

ناشر: IEEE

سال: 2014

Mode perturbations of a ring resonator for wideband and multiband filters

نوع: Conference Paper

نویسنده : Sheng Sun; Lei Zhu

ناشر: IEEE

سال: 2014

Comparative analysis of motion estimation algorithms on slow, medium and fast video sequences

نوع: Conference Paper

نویسنده : Arora, S.M. , Rajpal, N.

ناشر: IEEE

سال: 2014

Energy efficient mobile vision system for plant leaf disease identification

نوع: Conference Paper

نویسنده : Prasad, Shitala; Peddoju, Sateesh K.; Ghosh, D.

ناشر: IEEE

سال: 2014

Sampling large data on graphs

نوع: Conference Paper

نویسنده : Shomorony, Han; Avestimehr, A.Salman

ناشر: IEEE

سال: 2014

Hot-Carrier-Induced Forward and Reverse Saturation Current Degradations for the n-Type Symmetric EDMOS Transistor

نوع: Journal Paper

نویسنده : Weifeng Sun; Chunwei Zhang; Siyang Liu; Tingting Huang; Chaohui Yu; Wei Su; Aijun Zhang; Yuwei Liu; Xiaowei He; Xingwen Wu

ناشر: IEEE

سال: 2014

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Investigation of Electrostatic Integrity of Nanoscale Dual Material Gate Dielectric Pocket Silicon-on-Void (DMGDPSOV) MOSFET for Improved Device Scalability

Analysis of Correlated Gate and Drain Random Telegraph Noise in Post-Soft Breakdown TiN/HfLaO/<formula formulatype="inline"> <img src="/images/tex/20585.gif" alt="{\\rm SiO}_{x}"> </formula> nMOSFETs

Parallel Processing and Intercommunication of Multiple Negotiation Processes in E-Commerce for Optimal Business

PUF Interfaces and their Security

Uniform Selection of Vertices for Watermark Embedding in 3-D Polygon Mesh Using IEEE754 Floating Point Representation

Mode perturbations of a ring resonator for wideband and multiband filters

Comparative analysis of motion estimation algorithms on slow, medium and fast video sequences

Energy efficient mobile vision system for plant leaf disease identification

Sampling large data on graphs

Hot-Carrier-Induced Forward and Reverse Saturation Current Degradations for the n-Type Symmetric EDMOS Transistor

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Investigation of Electrostatic Integrity of Nanoscale Dual Material Gate Dielectric Pocket Silicon-on-Void (DMGDPSOV) MOSFET for Improved Device Scalability

Analysis of Correlated Gate and Drain Random Telegraph Noise in Post-Soft Breakdown TiN/HfLaO/<formula formulatype="inline"> <img src="/images/tex/20585.gif" alt="{\\rm SiO}_{x}"> </formula> nMOSFETs

Parallel Processing and Intercommunication of Multiple Negotiation Processes in E-Commerce for Optimal Business

PUF Interfaces and their Security

Uniform Selection of Vertices for Watermark Embedding in 3-D Polygon Mesh Using IEEE754 Floating Point Representation

Mode perturbations of a ring resonator for wideband and multiband filters

Comparative analysis of motion estimation algorithms on slow, medium and fast video sequences

Energy efficient mobile vision system for plant leaf disease identification

Sampling large data on graphs

Hot-Carrier-Induced Forward and Reverse Saturation Current Degradations for the n-Type Symmetric EDMOS Transistor