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Understanding the correlation of HCI and NBTI degradation in pLDMOSFETs from MR-DCIV technique

Type: Conference Paper

Author : Yandong He , Ganggang Zhang , Xing Zhang

Publisher: IEEE

Year: 2014

Understanding of self-heating enhanced degradation in pLDMOSFETs by MR-DCIV method

Type: Conference Paper

Author : Yandong He , Ganggang Zhang , Xing Zhang

Publisher: IEEE

Year: 2014

Author

Yandong He , Ganggang Zhang , Xing Zhang (2)

Publisher

IEEE (2)

Year

2014 (2)

Keywords

Ad hoc networks (1)

ad hoc networks (1)

crosstalk (1)

Detectors (1)

division multiplexing (1)

Equations (1)

Image color analysis (1)

Image edge detection (1)

Interference (1)

interference (signal) (1)

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Conference Paper (2)

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English (2)

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Metadata Only (2)

Publication Title

hysical and Failure Analysis of Integrated Circuits (IPFA), 2014 IEEE 21st International Symposium o (1)

ower Semiconductor Devices &amp; IC&#039;s (ISPSD), 2014 IEEE 26th International Symposium o (1)

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