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The non-diversifiable risk of financial reporting system: Evidence from the German market

Type: Journal Paper

Author : Yan-Ting Lin; Martin Nienhaus

Year: 2015

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An Improved Four-Port Equivalent Circuit Model of RF MOSFETs for Breakdown Operation

Type: Journal Paper

Author : Chie-In Lee; Yan-Ting Lin; Wei-Cheng Lin

Year: 2015

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A 2.4GHz high output power and high efficiency power amplifier operating at inductive breakdown in CMOS technology

Type: Journal Paper

Author : Chie-In Lee; Wei-Cheng Lin; Yan-Ting Lin

Year: 2014

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Investigation of Linearity in the High Electric Field Region for SiGe HBTs Based on Volterra Series

Type: Journal Paper

Author : Chie-In Le; Yan-Ting Lin; Wei-Cheng Lin

Publisher: IEEE

Year: 2014

Radio Frequency Current-Voltage Curve Including Breakdown Effect Implemented in Large Signal Model for Validation

Type: Journal Paper

Author : Chie-In Lee; Yan-Ting Lin; Wei-Cheng Lin

Publisher: IEEE

Year: 2014

A New Method to Determine Avalanche Multiplication Factor Using Vector Network Analyzer for p-n Junctions

Type: Journal Paper

Author : Chie-In Lee; Wei-Cheng Lin; Yan-Ting Lin

Publisher: IEEE

Year: 2014

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The non-diversifiable risk of financial reporting system: Evidence from the German market

An Improved Four-Port Equivalent Circuit Model of RF MOSFETs for Breakdown Operation

A 2.4GHz high output power and high efficiency power amplifier operating at inductive breakdown in CMOS technology

Investigation of Linearity in the High Electric Field Region for SiGe HBTs Based on Volterra Series

Radio Frequency Current-Voltage Curve Including Breakdown Effect Implemented in Large Signal Model for Validation

A New Method to Determine Avalanche Multiplication Factor Using Vector Network Analyzer for p-n Junctions

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The non-diversifiable risk of financial reporting system: Evidence from the German market

An Improved Four-Port Equivalent Circuit Model of RF MOSFETs for Breakdown Operation

A 2.4GHz high output power and high efficiency power amplifier operating at inductive breakdown in CMOS technology

Investigation of Linearity in the High Electric Field Region for SiGe HBTs Based on Volterra Series

Radio Frequency Current-Voltage Curve Including Breakdown Effect Implemented in Large Signal Model for Validation

A New Method to Determine Avalanche Multiplication Factor Using Vector Network Analyzer for p-n Junctions