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    Analog-to-Digital Converters: Digitizing the Analog World 

    Type: Journal Paper
    Author : Hae-Seung Lee; Sodini, C.G.
    Year: 2008
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    A high-speed CMOS comparator for use in an ADC 

    Type: Journal Paper
    Author : McCarroll, B.J.; Sodini, C.G.; Lee, H.-S.
    Year: 1988
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    A Column-Row-Parallel ASIC architecture for 3D wearable / portable medical ultrasonic imaging 

    Type: Conference Paper
    Author : Kailiang Chen , Hae-Seung Lee , Sodini, C.G.
    Publisher: IEEE
    Year: 2014

    Wireless behind-the-ear EEG recording device with wireless interface to a mobile device (iPhone/iPod touch) 

    Type: Conference Paper
    Author : Do Valle, B.G.; Cash, S.S.; Sodini, C.G.
    Publisher: IEEE
    Year: 2014

    A 256×256 CMOS imaging array with wide dynamic range pixels and column-parallel digital output 

    Type: Journal Paper
    Author : Decker, S.; McGrath, D.; Brehmer, K.; Sodini, C.G.
    Year: 1998
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    Comparator-Based Switched-Capacitor Circuits for Scaled CMOS Technologies 

    Type: Journal Paper
    Author : Fiorenza, J.K.; Sepke, T.; Holloway, P.; Sodini, C.G.; Hae-Seung Lee
    Publisher: IEEE
    Year: 2006
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    [IEEE 2006 IEEE International Solid-State Circuits Conference. Digest of Technical Papers - San Francisco, CA (2006.02.6-2006.02.9)] 2006 IEEE International Solid State Circuits Conference - Digest of Technical Papers - Comparator-based switched-capacitor circuits for scaled CMOS technologies 

    Type: Journal Paper
    Author : Sepke, T.; Fiorenza, J.K.; Sodini, C.G.; Holloway, P.; Hae-Seung Lee,
    Year: 2006
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    Bias-Stress Effect in Pentacene Organic Thin-Film Transistors 

    Type: Journal Paper
    Author : Ryu, K.K.; Nausieda, I.; He, D.D.; Akinwande, A.I.; Bulovic, V.; Sodini, C.G.
    Publisher: IEEE
    Year: 2010
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    A column-row-parallel ultrasound imaging architecture for 3d plane-wave imaging and Tx 2nd-order harmonic distortion (HD2) reduction 

    Type: Conference Paper
    Author : Kailiang Chen; Byung Chul Lee; Thomenius, K.; Khuri-Yakub, B.T.; Hae-Seung Lee; Sodini, C.G.
    Publisher: IEEE
    Year: 2014

    Si/Si1-xGex valence band discontinuity measurements using a semiconductor-insulator-semiconductor (SIS) heterostructure 

    Type: Journal Paper
    Author : Gan, C.H.; del Alamo, J.A.; Bennett, B.R.; Meyerson, B.S.; Crabbe, E.F.; Sodini, C.G.; Reif, L.R.
    Publisher: IEEE
    Year: 1994
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