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[IEEE 2008 23rd IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFTVS) - Cambridge, MA, USA (2008.10.1-2008.10.3)] 2008 IEEE International Symposium on Defect and Fault Tolerance of VLSI Systems - Using TMR Architectures for Yield Improvement

Type: Journal Paper

Author : Vial, J.; Bosio, A.; Girard, P.; Landrault, C.; Pravossoudovitch, S.; Virazel, A.

Year: 2008

90 nm SRAM Static and Dynamic Mode Real-Time Testing at Concordia Station in Antarctica

Type: Journal Paper

Author : Tsiligiannis, G.; Dilillo, L.; Bosio, A.; Girard, P.; Pravossoudovitch, S.; Virazel, A.; Cocquerez, P.; Autran, J.L.; Litterio, A.; Wrobel, F.; Saigne, F.

Publisher: IEEE

Year: 2014

An SRAM Based Monitor for Mixed-Field Radiation Environments

Type: Journal Paper

Author : Tsiligiannis, G.; Dilillo, L.; Bosio, A.; Girard, P.; Pravossoudovitch, S.; Todri, A.; Virazel, A.; Mekki, J.; Brugger, M.; Wrobel, F.; Saigné , Fré dé ric

Publisher: IEEE

Year: 2014

Multiple Cell Upset Classification<newline/> in Commercial SRAMs

Type: Journal Paper

Author : Tsiligiannis, G.; Dilillo, L.; Bosio, A.; Girard, P.; Pravossoudovitch, S.; Todri, A.; Virazel, A.; Puchner, H.; Frost, Christopher; Wrobel, F.; Saigné , Fré dé ric

Publisher: IEEE

Year: 2014

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[IEEE 2008 23rd IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFTVS) - Cambridge, MA, USA (2008.10.1-2008.10.3)] 2008 IEEE International Symposium on Defect and Fault Tolerance of VLSI Systems - Using TMR Architectures for Yield Improvement

90 nm SRAM Static and Dynamic Mode Real-Time Testing at Concordia Station in Antarctica

An SRAM Based Monitor for Mixed-Field Radiation Environments

Multiple Cell Upset Classification<newline/> in Commercial SRAMs

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[IEEE 2008 23rd IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFTVS) - Cambridge, MA, USA (2008.10.1-2008.10.3)] 2008 IEEE International Symposium on Defect and Fault Tolerance of VLSI Systems - Using TMR Architectures for Yield Improvement

90&#x00A0;nm SRAM Static and Dynamic Mode Real-Time Testing at Concordia Station in Antarctica

An SRAM Based Monitor for Mixed-Field Radiation Environments

Multiple Cell Upset Classification<newline/> in Commercial SRAMs

90 nm SRAM Static and Dynamic Mode Real-Time Testing at Concordia Station in Antarctica