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Atomistic Pseudo-Transient BTI Simulation With Inherent Workload Memory
Publisher: IEEE
Year: 2014
System Level Comparison of 3D Integration Technologies for Future Mobile MPSoC Platform
Publisher: IEEE
Year: 2014
Implications of BTI-Induced Time-Dependent Statistics on Yield Estimation of Digital Circuits
Publisher: IEEE
Year: 2014
Comparison of Reaction-Diffusion and Atomistic Trap-Based BTI Models for Logic Gates
Publisher: IEEE
Year: 2014