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Review of reliability bounds for consecutive-k-out-of-n systems

Type: Conference Paper

Author : Beiu, Valeriu; Daus, Leonard

Publisher: IEEE

Year: 2014

Reliability enhanced SRAM bit-cells

Type: Conference Paper

Author : Beiu, Valeriu; Tache, Mihai; Kharbash, Fekri

Publisher: IEEE

Year: 2014

A dual-voltage hybrid NEMS-CMOS low-power scheme

Type: Conference Paper

Author : Tache, Mihai; Beiu, Valeriu; Liu, Tsu-Jae King

Publisher: IEEE

Year: 2014

Author

Beiu, Valeriu (3)

Tache, Mihai (2)

Daus, Leonard (1)

Kharbash, Fekri (1)

Liu, Tsu-Jae King (1)

Publisher

IEEE (3)

Year

2014 (3)

Keywords

artificial intelligence (1)

n Air Force Satellite Control Network (1)

n artificial intelligence techniques (1)

n artificial satellites (1)

n data communication (1)

n data transmission (1)

n DC sources (1)

n Educational institutions (1)

n fast Fourier transform window (1)

n fast Fourier transforms (1)

Type

Conference Paper (3)

Language (ISO)

English (3)

Content Type

Metadata Only (3)

Publication Title

emiconductor Conference (CAS), 2014 International (2)

anotechnology (IEEE-NANO), 2014 IEEE 14th International Conference on (1)

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