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Dynamic Compact Model of Self-Referenced Magnetic Tunnel Junction

Type: Journal Paper

Author : Azevedo, Joao; Virazel, A.; Bosio, A.; Dilillo, L.; Girard, P.; Alvarez-Herault, Jeremy; Mackay, Ken

Publisher: IEEE

Year: 2014

A Complete Resistive-Open Defect Analysis for Thermally Assisted Switching MRAMs

Type: Journal Paper

Author : Azevedo, Joao; Virazel, A.; Bosio, A.; Dilillo, L.; Girard, P.; Todri-Sanial, Aida; Alvarez-Herault, Jeremy; Mackay, Ken

Publisher: IEEE

Year: 2014

Effects of the Heating Current Polarity on the Writing of Thermally Assisted Switching-MRAM

Type: Journal Paper

Author : Chavent, Antoine; Alvarez-Herault, Jeremy; Portemont, Celine; Creuzet, Claire; Pereira, J.; Vidal, Julien; Mackay, Ken; Sousa, Ricardo C.; Prejbeanu, Ioan L.; Dieny, Bernard

Publisher: IEEE

Year: 2014

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Dynamic Compact Model of Self-Referenced Magnetic Tunnel Junction

A Complete Resistive-Open Defect Analysis for Thermally Assisted Switching MRAMs

Effects of the Heating Current Polarity on the Writing of Thermally Assisted Switching-MRAM

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Dynamic Compact Model of Self-Referenced Magnetic Tunnel Junction

A Complete Resistive-Open Defect Analysis for Thermally Assisted Switching MRAMs

Effects of the Heating Current Polarity on the Writing of Thermally Assisted Switching-MRAM