Search

Now showing items 1-10 of 38

Effect of an organic buffer layer on the stability of zinc oxide thin film transistors

Type: Journal Paper

Publisher: American Scientific Publishers

Year: 2014

A one-phase, distribution-level phasor measurement unit for post-event analysis

Type: Conference Paper

Publisher: IEEE

Year: 2014

PICav: Precise, Iterative, and Complement-Based Cloud Storage Availability Calculation Scheme

Type: Conference Paper

Author : Spillner, Josef; Muller, Johannes

Publisher: IEEE

Year: 2014

Difference expansion based Reversible Data Hiding for medical images

Type: Conference Paper

Author : Vinoth, K.C.; Natarajan, V.; Santhosh, M.S.

Publisher: IEEE

Year: 2014

Bias Dependence of Total Ionizing Dose Effects in SiGe-<formula formulatype="inline"> <img src="/images/tex/21594.gif" alt="{{\\rm SiO}_2}/{{\\rm HfO}_2} p"> </formula>MOS FinFETs

Type: Journal Paper

Author : Guo Xing Duan; Cher Xuan Zhang; En Xia Zhang; Hachtel, Jordan; Fleetwood, D.M.; Schrimpf, R.D.; Reed, R.A.; Alles, Michael L.; Pantelides, Sokrates T.; Bersuker, Gennadi; Young, Chadwin D.

Publisher: IEEE

Year: 2014

Flexible TFT Circuit Analyzer Considering Process Variation, Aging, and Bending Effects

Type: Journal Paper

Author : En-Hua Ma; Wen-En Wei; Hung-Yi Li; Li, James Chien-Mo; Cheng, I-Chun; Yung-Hui Yeh

Publisher: IEEE

Year: 2014

Gate-Bias Stress Stability of P-Type SnO Thin-Film Transistors Fabricated by RF-Sputtering

Type: Journal Paper

Author : I-Chung Chiu; I-Chun Cheng

Publisher: IEEE

Year: 2014

nMOS Short Channel Device Characteristics After Soft Oxide Breakdown and Implications for Reliability Projections and Circuits

Type: Journal Paper

Author : Nicollian, Paul E.; Min Chen; Yang Yang; Chancellor, Cathy /A/.; Reddy, Viswanath K.

Publisher: IEEE

Year: 2014

Physical Origins and Analysis of Negative-Bias Stress Instability Mechanism in Polymer-Based Thin-Film Transistors

Type: Journal Paper

Author : Jaewook Lee; Jaeman Jang; Hyeongjung Kim; Jiyoul Lee; Bang-Lin Lee; Sung-Jin Choi; Dong Myong Kim; Dae Hwan Kim; Kyung Rok Kim

Publisher: IEEE

Year: 2014

Web 1.0 to Web 3.0 - Evolution of the Web and its various challenges

Type: Conference Paper

Author : Nath, K. , Dhar, S. , Basishtha, S.

Publisher: IEEE

Year: 2014

Search

Effect of an organic buffer layer on the stability of zinc oxide thin film transistors

A one-phase, distribution-level phasor measurement unit for post-event analysis

PICav: Precise, Iterative, and Complement-Based Cloud Storage Availability Calculation Scheme

Difference expansion based Reversible Data Hiding for medical images

Bias Dependence of Total Ionizing Dose Effects in SiGe-<formula formulatype="inline"> <img src="/images/tex/21594.gif" alt="{{\\rm SiO}_2}/{{\\rm HfO}_2} p"> </formula>MOS FinFETs

Flexible TFT Circuit Analyzer Considering Process Variation, Aging, and Bending Effects

Gate-Bias Stress Stability of P-Type SnO Thin-Film Transistors Fabricated by RF-Sputtering

nMOS Short Channel Device Characteristics After Soft Oxide Breakdown and Implications for Reliability Projections and Circuits

Physical Origins and Analysis of Negative-Bias Stress Instability Mechanism in Polymer-Based Thin-Film Transistors

Web 1.0 to Web 3.0 - Evolution of the Web and its various challenges

Author

Publisher

Year

Keywords

Type

Language (ISO)

Content Type

Publication Title

Search

Filters

Effect of an organic buffer layer on the stability of zinc oxide thin film transistors

A one-phase, distribution-level phasor measurement unit for post-event analysis

PICav: Precise, Iterative, and Complement-Based Cloud Storage Availability Calculation Scheme

Difference expansion based Reversible Data Hiding for medical images

Bias Dependence of Total Ionizing Dose Effects in SiGe-<formula formulatype="inline"> <img src="/images/tex/21594.gif" alt="{{\\rm SiO}_2}/{{\\rm HfO}_2} p"> </formula>MOS FinFETs

Flexible TFT Circuit Analyzer Considering Process Variation, Aging, and Bending Effects

Gate-Bias Stress Stability of P-Type SnO Thin-Film Transistors Fabricated by RF-Sputtering

nMOS Short Channel Device Characteristics After Soft Oxide Breakdown and Implications for Reliability Projections and Circuits

Physical Origins and Analysis of Negative-Bias Stress Instability Mechanism in Polymer-Based Thin-Film Transistors

Web 1.0 to Web 3.0 - Evolution of the Web and its various challenges