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    A Review of Watt-Level CMOS RF Power Amplifiers 

    Type: Journal Paper
    Author : Johansson, Torbjorn; Fritzin, Jonas
    Publisher: IEEE
    Year: 2014

    EATBit: Effective automated test for binary translation with high code coverage 

    Type: Conference Paper
    Publisher: IEEE
    Year: 2014

    Modeling, design, and demonstration of ultra-miniaturized and high efficiency 3D glass photonic modules 

    Type: Conference Paper
    Publisher: IEEE
    Year: 2014

    A Self-Adaptation Strategy for Service-Based Architectures 

    Type: Conference Paper
    Author : Oliveira, N.; Barbosa, L.S.
    Publisher: IEEE
    Year: 2014

    Modelling multi up gradations and related release time problems 

    Type: Conference Paper
    Author : Kapur, P.K.
    Publisher: IEEE
    Year: 2014

    ESD Protection Device With Dual-Polarity Conduction and High Blocking Voltage Realized in CMOS Process 

    Type: Journal Paper
    Author : Sirui Luo; Salcedo, Javier /A/.; Hajjar, Jean-Jacques; Yuanzhong Zhou; Liou, Juin J.
    Publisher: IEEE
    Year: 2014

    Normally-Off Thin-Film Silicon Heterojunction Field-Effect Transistors and Application to Complementary Circuits 

    Type: Journal Paper
    Author : Hekmatshoar, Bahman
    Publisher: IEEE
    Year: 2014

    Low Voltage Organic/Inorganic Hybrid Complementary Inverter With Low Temperature All Solution Processed Semiconductor and Dielectric Layers 

    Type: Journal Paper
    Author : Xiaojun Guo; Linrun Feng; Qingyu Cui; Xiaoli Xu
    Publisher: IEEE
    Year: 2014

    Area and Energy Efficient High-Performance ZnO Wavy Channel Thin-Film Transistor 

    Type: Journal Paper
    Author : Hanna, Amir N.; Ghoneim, M.T.; Bahabry, Rabab R.; Hussain, Aftab M.; Fahad, Hossain M.; Hussain, M.M.
    Publisher: IEEE
    Year: 2014

    Propagation of Plasma Diffusion Wave According to the Voltage Polarity in the Atmospheric Pressure Plasma Jet Columns 

    Type: Journal Paper
    Author : Guangsup Cho; Yun-Jung Kim; Eun Ha Choi; Han Sup Uhm
    Publisher: IEEE
    Year: 2014
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