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An assessment of simulation methodologies for the analysis of near-field radiation zones related to human exposure

Type: Conference Paper

Author : Espinosa, Hugo G.; Thiel, David V.; Brindley, Chris

Publisher: IEEE

Year: 2014

A 110 mW 6 bit 36 GS/s interleaved SAR ADC for 100 GBE occupying 0.048 mm<sup>2</sup> in 32 nm SOI CMOS

Type: Conference Paper

Author : Kull, Lukas; Pliva, Jan; Toifl, Thomas; Schmatz, Martin; Francese, Pier Andrea; Menolfi, Christian; Braendli, Matthias; Kossel, Marcel; Morf, Thomas; Andersen, Toke Meyer; Leblebici, Yusuf

Publisher: IEEE

Year: 2014

The electric field response of the Van Veen Loop

Type: Conference Paper

Author : McLean, James; Takizawa, Koji; Midori, Masataka; Kurihara, Hiroshi; Sutton, Robert

Publisher: IEEE

Year: 2014

Estimation of the electromagnetic fields excited by a cellular phone in a typical aircraft cabin

Type: Conference Paper

Author : Shirafune, Masami; Hikage, Takashi; Nojima, Toshio; Futatsumori, Shunichi; Kohmura, Akiko; Yonemoto, Naruto

Publisher: IEEE

Year: 2014

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An assessment of simulation methodologies for the analysis of near-field radiation zones related to human exposure

A 110 mW 6 bit 36 GS/s interleaved SAR ADC for 100 GBE occupying 0.048 mm<sup>2</sup> in 32 nm SOI CMOS

The electric field response of the Van Veen Loop

Estimation of the electromagnetic fields excited by a cellular phone in a typical aircraft cabin

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An assessment of simulation methodologies for the analysis of near-field radiation zones related to human exposure

A 110 mW 6 bit 36 GS/s interleaved SAR ADC for 100 GBE occupying 0.048 mm<sup>2</sup> in 32 nm SOI CMOS

The electric field response of the Van Veen Loop

Estimation of the electromagnetic fields excited by a cellular phone in a typical aircraft cabin