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Assessment index of wind power capacity credit

Type: Conference Paper

Author : Yang Cui; Yutian Liu

Publisher: IEEE

Year: 2014

Multiuser Two-Way Filter-and-Forward Relaying for Ultra-Wideband Communications

Type: Conference Paper

Author : Ahmadian, Zahra; Lampe, Lutz; Mietzner, Jan

Publisher: IEEE

Year: 2014

Metamorphic relations to improve the test accuracy of Multi Precision Arithmetic software applications

Type: Conference Paper

Author : Aruna, Chittineni; Prasad, R.Siva Ram

Publisher: IEEE

Year: 2014

Plant-level ESD standards and the practical protection engineering of China's electronics manufacturing industry

Type: Conference Paper

Author : Zou, Jinlin; Wang, Youliang; Lai, Ping; Luo, Daojun

Publisher: IEEE

Year: 2014

Creation and use compact thermal models for virtual prototyping of electronic assemblies from a semiconductor companies perspective

Type: Conference Paper

Author : Janssen, J.H.J.

Publisher: IEEE

Year: 2014

Quick EMI solution based on the EM field distribution

Type: Conference Paper

Author : Huang, Minchao

Publisher: IEEE

Year: 2014

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Assessment index of wind power capacity credit

Multiuser Two-Way Filter-and-Forward Relaying for Ultra-Wideband Communications

Metamorphic relations to improve the test accuracy of Multi Precision Arithmetic software applications

Plant-level ESD standards and the practical protection engineering of China's electronics manufacturing industry

Creation and use compact thermal models for virtual prototyping of electronic assemblies from a semiconductor companies perspective

Quick EMI solution based on the EM field distribution

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Assessment index of wind power capacity credit

Multiuser Two-Way Filter-and-Forward Relaying for Ultra-Wideband Communications

Metamorphic relations to improve the test accuracy of Multi Precision Arithmetic software applications

Plant-level ESD standards and the practical protection engineering of China's electronics manufacturing industry

Creation and use compact thermal models for virtual prototyping of electronic assemblies from a semiconductor companies perspective

Quick EMI solution based on the EM field distribution