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Equi-Noise: A Statistical Model That Combines Embedded Memory Failures and Channel Noise

Type: Journal Paper

Author : Khairy, Muhammad S.; Khajeh, Amin; Eltawil, Ahmed M.; Kurdahi, F.J.

Publisher: IEEE

Year: 2014

Energy Barrier Model of SRAM for Improved Energy and Error Rates

Type: Journal Paper

Author : Das, Joydeep; Ghosh, Sudip

Publisher: IEEE

Year: 2014

Ready-set-transfer! Technology transfer in the requirements engineering domain (panel)

Type: Conference Paper

Author : Huffman Hayes, J. , Zowghi, D.

Publisher: IEEE

Year: 2014

Fast and viewpoint robust human detection for SAR operations

Type: Conference Paper

Author : Blondel, P.; Potelle, A.; Pegard, C.; Lozano, R.

Publisher: IEEE

Year: 2014

Author

Blondel, P. (1)

Das, Joydeep (1)

Eltawil, Ahmed M. (1)

Ghosh, Sudip (1)

Huffman Hayes, J. , Zowghi, D. (1)

Khairy, Muhammad S. (1)

Khajeh, Amin (1)

Kurdahi, F.J. (1)

Lozano, R. (1)

Pegard, C. (1)

Publisher

IEEE (4)

Year

2014 (4)

Keywords

cache storage (2)

Integrated circuit modeling (2)

Noise (2)

3DP (1)

Assist circuits (1)

bank failures (1)

bank granularity (1)

Bit error rate (1)

cache line (1)

channel state aware (1)

Type

Conference Paper (2)

Journal Paper (2)

Language (ISO)

English (4)

Content Type

Metadata Only (4)

Publication Title

Circuits and Systems I: Regular Papers, IEEE Transactions on (2)

afety, Security, and Rescue Robotics (SSRR), 2014 IEEE International Symposium on (1)

equirements Engineering Conference (RE), 2014 IEEE 22nd International (1)

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