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    Localization of critical frequency for simulation of high-speed interconnects 

    Type: Conference Paper
    Author : Wen Ding; Feng Liu; Sheng Liu; Gaofeng Wang
    Publisher: IEEE
    Year: 2014

    Turbojet engine innovation and TRIZ 

    Type: Conference Paper
    Author : Katolický , Z.; Buš ov, B.; Bartlová , M.
    Publisher: IEEE
    Year: 2014

    Anti-pattern detection with model queries: A comparison of approaches 

    Type: Conference Paper
    Publisher: IEEE
    Year: 2014

    Towards Scalable Distributed Graph Database Engine for Hybrid Clouds 

    Type: Conference Paper
    Author : Dayarathna, M.; Suzumura, T.
    Publisher: IEEE
    Year: 2014

    Objective keyword selection for lecture video annotation 

    Type: Conference Paper
    Author : Imran, Ali Shariq; Rahadianti, Laksmita; Cheikh, Faouzi Alaya; Yayilgan, Sule Yildirim
    Publisher: IEEE
    Year: 2014

    Estimation of inverse model based on ANN and PSO with adaptively varying acceleration coefficients 

    Type: Conference Paper
    Author : Kinoshita, K.; Watanabe, K.; Isshiki, M.
    Publisher: IEEE
    Year: 2014

    Comparative evaluation of Tunnel-FET ultra-low voltage SRAM bitcell and impact of variations 

    Type: Conference Paper
    Author : Alioto, Massimo; Esseni, David
    Publisher: IEEE
    Year: 2014

    Electric Measurement of the Critical Current, AC Loss, and Current Distribution of a Prototype HTS Cable 

    Type: Journal Paper
    Author : Jiahui Zhu; Zhenyu Zhang; Huiming Zhang; Min Zhang; Ming Qiu; Weijia Yuan
    Publisher: IEEE
    Year: 2014

    Electric Loss Measurement Technique for Synchronous PM Brushless Machines 

    Type: Journal Paper
    Author : Armando, Eric; Villata, Franco; Guglielmi, Paolo
    Publisher: IEEE
    Year: 2014

    Acoustic Emission in Power Semiconductor Modules—First Observations 

    Type: Journal Paper
    Author : Kä rkkä inen, Tommi J.; Talvitie, Joonas P.; Kuisma, Mikko; Hannonen, J.; Strom, Juha-P.; Mengotti, Elena; Silventoinen, Pertti
    Publisher: IEEE
    Year: 2014
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