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RISImpacts of NBTI/PBTI on performance of domino logic circuits with high-k metal-gate devices in nanoscale CMOS
Year: 2012
Abstract:
Negative-bias temperature instability (NBTI) and positive-bias temperature instability (PBTI) weaken
PFETs and high-k metal-gate NFETs, respectively. This paper provides comprehensive analyses on the
impacts of NBTI and PBTI on wide...
Analyzing sentimental influence of posts on social networks
Publisher: IEEE
Year: 2014
Impact of NBTI on performance of domino logic circuits in nano-scale CMOS
Year: 2011
Abstract:
Negative Bias Temperature Instability (NBTI) in pMOS transistors has become a major reliability
concern in the state-of-the art digital circuit design. This paper discusses the effects of NBTI on 32 nm
technology high fan-in dynamic...
Aging Statistics Based on Trapping/Detrapping: Compact Modeling and Silicon Validation
Publisher: IEEE
Year: 2014
Adaptive Technique for Overcoming Performance Degradation Due to Aging on 6T SRAM Cells
Publisher: IEEE
Year: 2014
Threshold voltage instability mechanisms of nitride based charge trap flash memory A review
Publisher: American Scientific Publishers
Year: 2014
Universal relaxation characteristic of interface trap under FN and NBTI stress in pMOSFET device
Publisher: IET
Year: 2014
Energy/Lifetime Cooptimization by Cache Partitioning With Graceful Performance Degradation
Publisher: IEEE
Year: 2014
NiCo nanoparticles-doped ZnO nano array and The Magnetic Properties
Publisher: IEEE
Year: 2014