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Now showing items 1-7 of 7

90 nm SRAM Static and Dynamic Mode Real-Time Testing at Concordia Station in Antarctica

Type: Journal Paper

Author : Tsiligiannis, G.; Dilillo, L.; Bosio, A.; Girard, P.; Pravossoudovitch, S.; Virazel, A.; Cocquerez, P.; Autran, J.L.; Litterio, A.; Wrobel, F.; Saigne, F.

Publisher: IEEE

Year: 2014

Determining Realistic Parameters for the <newline/> Double Exponential Law that Models<newline/> Transient Current Pulses

Type: Journal Paper

Author : Wrobel, F.; Dilillo, L.; Touboul, A.D.; Pouget, V.; Saigné , Fré dé ric

Publisher: IEEE

Year: 2014

Single-Event Pulse Broadening After Narrowing Effect in Nano-CMOS Logic Circuits

Type: Journal Paper

Author : Pengcheng Huang; Shuming Chen; Jianjun Chen; Bin Liang; Biwei Liu

Publisher: IEEE

Year: 2014

Gate Voltage Contribution to Neutron-Induced SEB of Trench Gate Fieldstop IGBT

Type: Journal Paper

Author : Foro, L.L.; Touboul, A.D.; Michez, A.; Wrobel, F.; Rech, P.; Dilillo, L.; Frost, Christopher; Saigné , Fré dé ric

Publisher: IEEE

Year: 2014

Multiple Cell Upset Classification<newline/> in Commercial SRAMs

Type: Journal Paper

Author : Tsiligiannis, G.; Dilillo, L.; Bosio, A.; Girard, P.; Pravossoudovitch, S.; Todri, A.; Virazel, A.; Puchner, H.; Frost, Christopher; Wrobel, F.; Saigné , Fré dé ric

Publisher: IEEE

Year: 2014

LTE Wireless Network Virtualization: Dynamic Slicing via Flexible Scheduling

Type: Conference Paper

Author : Kamel, Mahmoud I.; Le, Long Bao; Girard, Andre

Publisher: IEEE

Year: 2014

STSP: Space-time stretched pulse for measuring spatio-temporal impulse response

Type: Conference Paper

Publisher: IEEE

Year: 2014

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90 nm SRAM Static and Dynamic Mode Real-Time Testing at Concordia Station in Antarctica

Determining Realistic Parameters for the <newline/> Double Exponential Law that Models<newline/> Transient Current Pulses

Single-Event Pulse Broadening After Narrowing Effect in Nano-CMOS Logic Circuits

Gate Voltage Contribution to Neutron-Induced SEB of Trench Gate Fieldstop IGBT

Multiple Cell Upset Classification<newline/> in Commercial SRAMs

LTE Wireless Network Virtualization: Dynamic Slicing via Flexible Scheduling

STSP: Space-time stretched pulse for measuring spatio-temporal impulse response

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90&#x00A0;nm SRAM Static and Dynamic Mode Real-Time Testing at Concordia Station in Antarctica

Determining Realistic Parameters for the <newline/> Double Exponential Law that Models<newline/> Transient Current Pulses

Single-Event Pulse Broadening After Narrowing Effect in Nano-CMOS Logic Circuits

Gate Voltage Contribution to Neutron-Induced SEB of Trench Gate Fieldstop IGBT

Multiple Cell Upset Classification<newline/> in Commercial SRAMs

LTE Wireless Network Virtualization: Dynamic Slicing via Flexible Scheduling

STSP: Space-time stretched pulse for measuring spatio-temporal impulse response

90 nm SRAM Static and Dynamic Mode Real-Time Testing at Concordia Station in Antarctica