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Application of on-wafer TRL calibration on the measurement of microwave properties of Ba/sub 0.5/Sr/sub 0.5/TiO/sub 3/ films

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نرم افزار کتابخانه دیجیتال "دی اسپیس" فارسی شده توسط یابش برای کتابخانه های ایرانی | تماس با یابش