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An automatic questionnaire survey model based on the collective message over the internet

Author:
Jiang-Liang Hou , Yuh-Zong Chu
Publisher:
IEEE
Year
: 2014
DOI: 10.1109/ICSICT.2014.7021666
URI: http://libsearch.um.ac.ir:80/fum/handle/fum/999062
Keyword(s): SRAM chips,flip-flops,integrated circuit reliability,low-power electronics,oscillators,BTI stresses,DC stress,SRAM,duty-cycle measurement,dynamic register files,inverter chain based ring oscillator,reliability structure,static BTI stress,Abstracts,Degradation,Integrated circuit reliability,Oscillators,Reliability engineering,Temperature measurement
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    An automatic questionnaire survey model based on the collective message over the internet

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contributor authorJiang-Liang Hou , Yuh-Zong Chu
date accessioned2020-03-12T20:01:40Z
date available2020-03-12T20:01:40Z
date issued2014
identifier other6846901.pdf
identifier urihttp://libsearch.um.ac.ir:80/fum/handle/fum/999062
formatgeneral
languageEnglish
publisherIEEE
titleAn automatic questionnaire survey model based on the collective message over the internet
typeConference Paper
contenttypeMetadata Only
identifier padid8119345
subject keywordsSRAM chips
subject keywordsflip-flops
subject keywordsintegrated circuit reliability
subject keywordslow-power electronics
subject keywordsoscillators
subject keywordsBTI stresses
subject keywordsDC stress
subject keywordsSRAM
subject keywordsduty-cycle measurement
subject keywordsdynamic register files
subject keywordsinverter chain based ring oscillator
subject keywordsreliability structure
subject keywordsstatic BTI stress
subject keywordsAbstracts
subject keywordsDegradation
subject keywordsIntegrated circuit reliability
subject keywordsOscillators
subject keywordsReliability engineering
subject keywordsTemperature measurement
identifier doi10.1109/ICSICT.2014.7021666
journal titleomputer Supported Cooperative Work in Design (CSCWD), Proceedings of the 2014 IEEE 18th Internationa
filesize1621551
citations0
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