MIAMI: A framework for application performance diagnosis
Publisher:
Year
: 2014DOI: 10.1109/ICCDCS.2014.7016162
Keyword(s): Young',s modulus,aluminium,electrical resistivity,elemental semiconductors,microactuators,micromachining,silicon,silicon compounds,thermal conductivity,Al,PolyMEMS-INAOE fabrication process,Si,SiN,SiO<,sub>,2<,/sub>,Young',s modulus,bulk-surface micromachined polyMEMS test chip,compression stresses,doping level,electrical property characterization,electrical resistivity,mechanical actuators,mechanical properties,monocrystalline silicon,phosphosilicate glas
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MIAMI: A framework for application performance diagnosis
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| contributor author | Marin, G. , Dongarra, J. , Terpstra, D. | |
| date accessioned | 2020-03-12T19:59:07Z | |
| date available | 2020-03-12T19:59:07Z | |
| date issued | 2014 | |
| identifier other | 6844480.pdf | |
| identifier uri | http://libsearch.um.ac.ir:80/fum/handle/fum/997566 | |
| format | general | |
| language | English | |
| publisher | IEEE | |
| title | MIAMI: A framework for application performance diagnosis | |
| type | Conference Paper | |
| contenttype | Metadata Only | |
| identifier padid | 8117542 | |
| subject keywords | Young' | |
| subject keywords | s modulus | |
| subject keywords | aluminium | |
| subject keywords | electrical resistivity | |
| subject keywords | elemental semiconductors | |
| subject keywords | microactuators | |
| subject keywords | micromachining | |
| subject keywords | silicon | |
| subject keywords | silicon compounds | |
| subject keywords | thermal conductivity | |
| subject keywords | Al | |
| subject keywords | PolyMEMS-INAOE fabrication process | |
| subject keywords | Si | |
| subject keywords | SiN | |
| subject keywords | SiO< | |
| subject keywords | sub> | |
| subject keywords | 2< | |
| subject keywords | /sub> | |
| subject keywords | Young' | |
| subject keywords | s modulus | |
| subject keywords | bulk-surface micromachined polyMEMS test chip | |
| subject keywords | compression stresses | |
| subject keywords | doping level | |
| subject keywords | electrical property characterization | |
| subject keywords | electrical resistivity | |
| subject keywords | mechanical actuators | |
| subject keywords | mechanical properties | |
| subject keywords | monocrystalline silicon | |
| subject keywords | phosphosilicate glas | |
| identifier doi | 10.1109/ICCDCS.2014.7016162 | |
| journal title | erformance Analysis of Systems and Software (ISPASS), 2014 IEEE International Symposium on | |
| filesize | 1035003 | |
| citations | 0 |