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Do System Test Cases Grow Old?

Author:
Feldt, R.
Publisher:
IEEE
Year
: 2014
DOI: 10.1109/SiPS.2014.6986104
URI: http://libsearch.um.ac.ir:80/fum/handle/fum/991566
Keyword(s): Decision support systems,Generators,Government,Pareto analysis,Power demand,Topology
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    Do System Test Cases Grow Old?

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contributor authorFeldt, R.
date accessioned2020-03-12T19:49:36Z
date available2020-03-12T19:49:36Z
date issued2014
identifier other6823896.pdf
identifier urihttp://libsearch.um.ac.ir:80/fum/handle/fum/991566?locale-attribute=en
formatgeneral
languageEnglish
publisherIEEE
titleDo System Test Cases Grow Old?
typeConference Paper
contenttypeMetadata Only
identifier padid8108279
subject keywordsDecision support systems
subject keywordsGenerators
subject keywordsGovernment
subject keywordsPareto analysis
subject keywordsPower demand
subject keywordsTopology
identifier doi10.1109/SiPS.2014.6986104
journal titleoftware Testing, Verification and Validation (ICST), 2014 IEEE Seventh International Conference on
filesize5877281
citations0
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