Towards verifying determinism of SystemC designs
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: 2014شناسه الکترونیک: 10.1109/CICC.2014.6946066
کلیدواژه(گان): CMOS integrated circuits,differential amplifiers,feedback amplifiers,wideband amplifiers,CMOS,UGB differential class-AB amplifier,bias-dependent crossover distortion reduction,common-mode feedback,current 3.9 mA,frequency 110 MHz,frequency 150 kHz,low supply voltage,output drive capability,resistance 50 ohm,size 65 nm,unity-gain configuration,voltage 1.2 V,voltage 1.6 V,wideband differential 3-stage class-AB amplifier,Bandwidth,CMOS integrated circuits,Capacitance,Distortio
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Towards verifying determinism of SystemC designs
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contributor author | Le, H.M. , Drechsler, R. | |
date accessioned | 2020-03-12T19:40:30Z | |
date available | 2020-03-12T19:40:30Z | |
date issued | 2014 | |
identifier other | 6800367.pdf | |
identifier uri | http://libsearch.um.ac.ir:80/fum/handle/fum/985767 | |
format | general | |
language | English | |
publisher | IEEE | |
title | Towards verifying determinism of SystemC designs | |
type | Conference Paper | |
contenttype | Metadata Only | |
identifier padid | 8101454 | |
subject keywords | CMOS integrated circuits | |
subject keywords | differential amplifiers | |
subject keywords | feedback amplifiers | |
subject keywords | wideband amplifiers | |
subject keywords | CMOS | |
subject keywords | UGB differential class-AB amplifier | |
subject keywords | bias-dependent crossover distortion reduction | |
subject keywords | common-mode feedback | |
subject keywords | current 3.9 mA | |
subject keywords | frequency 110 MHz | |
subject keywords | frequency 150 kHz | |
subject keywords | low supply voltage | |
subject keywords | output drive capability | |
subject keywords | resistance 50 ohm | |
subject keywords | size 65 nm | |
subject keywords | unity-gain configuration | |
subject keywords | voltage 1.2 V | |
subject keywords | voltage 1.6 V | |
subject keywords | wideband differential 3-stage class-AB amplifier | |
subject keywords | Bandwidth | |
subject keywords | CMOS integrated circuits | |
subject keywords | Capacitance | |
subject keywords | Distortio | |
identifier doi | 10.1109/CICC.2014.6946066 | |
journal title | esign, Automation and Test in Europe Conference and Exhibition (DATE), 2014 | |
filesize | 172332 | |
citations | 0 |