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Privacy as a Tradeoff: Introducing the Notion of Privacy Calculus for Context-Aware Mobile Applications

Author:
Zhan Liu , Jialu Shan , Bonazzi, R. , Pigneur, Y.
Publisher:
IEEE
Year
: 2014
DOI: 10.1109/ICDCSyst.2014.6926123
URI: http://libsearch.um.ac.ir:80/fum/handle/fum/981117
Keyword(s): III-V semiconductors,carrier density,field effect transistors,high electron mobility transistors,indium compounds,logic devices,low-power electronics,quantum well devices,technology CAD (electronics),HEMT,III-V compound semiconductor,InSb,analogue transistors,device OFF current,device threshold voltage,doping concentration,high performance applications,high speed applications,low power logic applications,maximum drain current,physical gate length,quantum well field effect tr
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    Privacy as a Tradeoff: Introducing the Notion of Privacy Calculus for Context-Aware Mobile Applications

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contributor authorZhan Liu , Jialu Shan , Bonazzi, R. , Pigneur, Y.
date accessioned2020-03-12T19:32:24Z
date available2020-03-12T19:32:24Z
date issued2014
identifier other6758735.pdf
identifier urihttp://libsearch.um.ac.ir:80/fum/handle/fum/981117?locale-attribute=en
formatgeneral
languageEnglish
publisherIEEE
titlePrivacy as a Tradeoff: Introducing the Notion of Privacy Calculus for Context-Aware Mobile Applications
typeConference Paper
contenttypeMetadata Only
identifier padid8095648
subject keywordsIII-V semiconductors
subject keywordscarrier density
subject keywordsfield effect transistors
subject keywordshigh electron mobility transistors
subject keywordsindium compounds
subject keywordslogic devices
subject keywordslow-power electronics
subject keywordsquantum well devices
subject keywordstechnology CAD (electronics)
subject keywordsHEMT
subject keywordsIII-V compound semiconductor
subject keywordsInSb
subject keywordsanalogue transistors
subject keywordsdevice OFF current
subject keywordsdevice threshold voltage
subject keywordsdoping concentration
subject keywordshigh performance applications
subject keywordshigh speed applications
subject keywordslow power logic applications
subject keywordsmaximum drain current
subject keywordsphysical gate length
subject keywordsquantum well field effect tr
identifier doi10.1109/ICDCSyst.2014.6926123
journal titleystem Sciences (HICSS), 2014 47th Hawaii International Conference on
filesize291305
citations0
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