Scalable Low Power FFT/IFFT Architecture with Dynamic Bit Width Configurability
سال
: 2014شناسه الکترونیک: 10.1109/PVSC.2014.6924916
کلیدواژه(گان): crystal structure,heating,sputter deposition,thermophotovoltaic cells,thin films,tin compounds,RF-sputtering,SnS,crystal structure,electron dispersive spectroscopy measurement,in situ heating,photovoltaic application,photovoltaic device performance,pulsed heating,substrate heating,tin disulfide,tin monosulfide,tin sulfide thin films,Conductivity,Heating,Morphology,Plasma temperature,Substrates,Temperature,Temperature measurement,SnS,SnS<,inf>,2<,/inf>,X-ray di
کالکشن
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آمار بازدید
Scalable Low Power FFT/IFFT Architecture with Dynamic Bit Width Configurability
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| date accessioned | 2020-03-12T19:30:13Z | |
| date available | 2020-03-12T19:30:13Z | |
| date issued | 2014 | |
| identifier other | 6733157.pdf | |
| identifier uri | http://libsearch.um.ac.ir:80/fum/handle/fum/979898?locale-attribute=fa | |
| format | general | |
| language | English | |
| title | Scalable Low Power FFT/IFFT Architecture with Dynamic Bit Width Configurability | |
| type | Conference Paper | |
| contenttype | Metadata Only | |
| identifier padid | 8094081 | |
| subject keywords | crystal structure | |
| subject keywords | heating | |
| subject keywords | sputter deposition | |
| subject keywords | thermophotovoltaic cells | |
| subject keywords | thin films | |
| subject keywords | tin compounds | |
| subject keywords | RF-sputtering | |
| subject keywords | SnS | |
| subject keywords | crystal structure | |
| subject keywords | electron dispersive spectroscopy measurement | |
| subject keywords | in situ heating | |
| subject keywords | photovoltaic application | |
| subject keywords | photovoltaic device performance | |
| subject keywords | pulsed heating | |
| subject keywords | substrate heating | |
| subject keywords | tin disulfide | |
| subject keywords | tin monosulfide | |
| subject keywords | tin sulfide thin films | |
| subject keywords | Conductivity | |
| subject keywords | Heating | |
| subject keywords | Morphology | |
| subject keywords | Plasma temperature | |
| subject keywords | Substrates | |
| subject keywords | Temperature | |
| subject keywords | Temperature measurement | |
| subject keywords | SnS | |
| subject keywords | SnS< | |
| subject keywords | inf> | |
| subject keywords | 2< | |
| subject keywords | /inf> | |
| subject keywords | X-ray di | |
| identifier doi | 10.1109/PVSC.2014.6924916 | |
| journal title | LSI Design and 2014 13th International Conference on Embedded Systems, 2014 27th International Confe | |
| filesize | 249741 | |
| citations | 0 | |
| contributor rawauthor | Rangachari, S. , Balakrishnan, J. , Chandrachoodan, N. |