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Scalable Low Power FFT/IFFT Architecture with Dynamic Bit Width Configurability

Author:
Rangachari, S. , Balakrishnan, J. , Chandrachoodan, N.
Year
: 2014
DOI: 10.1109/PVSC.2014.6924916
URI: http://libsearch.um.ac.ir:80/fum/handle/fum/979898
Keyword(s): crystal structure,heating,sputter deposition,thermophotovoltaic cells,thin films,tin compounds,RF-sputtering,SnS,crystal structure,electron dispersive spectroscopy measurement,in situ heating,photovoltaic application,photovoltaic device performance,pulsed heating,substrate heating,tin disulfide,tin monosulfide,tin sulfide thin films,Conductivity,Heating,Morphology,Plasma temperature,Substrates,Temperature,Temperature measurement,SnS,SnS<,inf>,2<,/inf>,X-ray di
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    Scalable Low Power FFT/IFFT Architecture with Dynamic Bit Width Configurability

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date accessioned2020-03-12T19:30:13Z
date available2020-03-12T19:30:13Z
date issued2014
identifier other6733157.pdf
identifier urihttp://libsearch.um.ac.ir:80/fum/handle/fum/979898?locale-attribute=en
formatgeneral
languageEnglish
titleScalable Low Power FFT/IFFT Architecture with Dynamic Bit Width Configurability
typeConference Paper
contenttypeMetadata Only
identifier padid8094081
subject keywordscrystal structure
subject keywordsheating
subject keywordssputter deposition
subject keywordsthermophotovoltaic cells
subject keywordsthin films
subject keywordstin compounds
subject keywordsRF-sputtering
subject keywordsSnS
subject keywordscrystal structure
subject keywordselectron dispersive spectroscopy measurement
subject keywordsin situ heating
subject keywordsphotovoltaic application
subject keywordsphotovoltaic device performance
subject keywordspulsed heating
subject keywordssubstrate heating
subject keywordstin disulfide
subject keywordstin monosulfide
subject keywordstin sulfide thin films
subject keywordsConductivity
subject keywordsHeating
subject keywordsMorphology
subject keywordsPlasma temperature
subject keywordsSubstrates
subject keywordsTemperature
subject keywordsTemperature measurement
subject keywordsSnS
subject keywordsSnS<
subject keywordsinf>
subject keywords2<
subject keywords/inf>
subject keywordsX-ray di
identifier doi10.1109/PVSC.2014.6924916
journal titleLSI Design and 2014 13th International Conference on Embedded Systems, 2014 27th International Confe
filesize249741
citations0
contributor rawauthorRangachari, S. , Balakrishnan, J. , Chandrachoodan, N.
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