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contributor authorWenping Zhang
contributor authorDehong Xu
contributor authorEnjeti, Prasad N.
contributor authorHaijin Li
contributor authorHawke, J.T.
contributor authorKrishnamoorthy, Harish S.
date accessioned2020-03-12T18:44:58Z
date available2020-03-12T18:44:58Z
date issued2014
identifier issn0885-8993
identifier other6731601.pdf
identifier urihttp://libsearch.um.ac.ir:80/fum/handle/fum/968820?locale-attribute=en&show=full
formatgeneral
languageEnglish
publisherIEEE
titleSurvey on Fault-Tolerant Techniques for Power Electronic Converters
typeJournal Paper
contenttypeMetadata Only
identifier padid8003007
subject keywordsfault tolerance
subject keywordspower convertors
subject keywordspower system faults
subject keywordspower system reliability
subject keywordsfault tolerant techniques
subject keywordspower electronic converters
subject keywordspower semiconductor device failures
subject keywordssystem reliability analysis
subject keywordsCircuit faults
subject keywordsFault tolerant systems
subject keywordsFuses
subject keywordsRedundancy
subject keywordsSwitches
subject keywordsTopology
subject keywordsFault-tolerance
subject keywordspostfault operation
subject keywordspower electronic converters
subject keywordssystem reliability
identifier doi10.1109/TPEL.2014.2304561
journal titlePower Electronics, IEEE Transactions on
journal volume29
journal issue12
filesize1417230
citations0


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