On-Wafer Analog Pulse Generator for Fast Characterization and Parametric Test of Resistive Switching Memories
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: 2014DOI: 10.1109/TSM.2014.2302415
Keyword(s): automatic test equipment,logic testing,phase change memories,ReRAM,automated test equipment,nonvolatile memories,on-wafer analog pulse generator,on-wafer pulse generator,phase change memories,resistive switching memories,resistive-RAM,time 50 ns to 350 ns,voltage 0.5 V to 4.5 V,wafer scribe lanes,Accuracy,Computer architecture,Microprocessors,Programming,Pulse generation,Switches,Testing,Integrated circuits,analog circuits,memory testing,phase change memory,pulse generat
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On-Wafer Analog Pulse Generator for Fast Characterization and Parametric Test of Resistive Switching Memories
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| contributor author | Covi, E. | |
| contributor author | Cabrini, Alessandro | |
| contributor author | Vendrame, L. | |
| contributor author | Bortesi, L. | |
| contributor author | Gastaldi, R. | |
| contributor author | Torelli, Guido | |
| date accessioned | 2020-03-12T18:42:38Z | |
| date available | 2020-03-12T18:42:38Z | |
| date issued | 2014 | |
| identifier issn | 0894-6507 | |
| identifier other | 6722889.pdf | |
| identifier uri | http://libsearch.um.ac.ir:80/fum/handle/fum/967696?locale-attribute=en | |
| format | general | |
| language | English | |
| publisher | IEEE | |
| title | On-Wafer Analog Pulse Generator for Fast Characterization and Parametric Test of Resistive Switching Memories | |
| type | Journal Paper | |
| contenttype | Metadata Only | |
| identifier padid | 8001708 | |
| subject keywords | automatic test equipment | |
| subject keywords | logic testing | |
| subject keywords | phase change memories | |
| subject keywords | ReRAM | |
| subject keywords | automated test equipment | |
| subject keywords | nonvolatile memories | |
| subject keywords | on-wafer analog pulse generator | |
| subject keywords | on-wafer pulse generator | |
| subject keywords | phase change memories | |
| subject keywords | resistive switching memories | |
| subject keywords | resistive-RAM | |
| subject keywords | time 50 ns to 350 ns | |
| subject keywords | voltage 0.5 V to 4.5 V | |
| subject keywords | wafer scribe lanes | |
| subject keywords | Accuracy | |
| subject keywords | Computer architecture | |
| subject keywords | Microprocessors | |
| subject keywords | Programming | |
| subject keywords | Pulse generation | |
| subject keywords | Switches | |
| subject keywords | Testing | |
| subject keywords | Integrated circuits | |
| subject keywords | analog circuits | |
| subject keywords | memory testing | |
| subject keywords | phase change memory | |
| subject keywords | pulse generat | |
| identifier doi | 10.1109/TSM.2014.2302415 | |
| journal title | Semiconductor Manufacturing, IEEE Transactions on | |
| journal volume | 27 | |
| journal issue | 2 | |
| filesize | 20733320 | |
| citations | 0 |