Frequency-Independent Warning Detection Sequential for Dynamic Voltage and Frequency Scaling in ASICs
Publisher:
Year
: 2014DOI: 10.1109/TVLSI.2013.2296033
Keyword(s): application specific integrated circuits,flip-flops,integrated circuit design,integrated circuit reliability,low-power electronics,ASIC,Kogge stone adder,dynamic voltage scaling,edge detector,frequency independent warning detection,frequency scaling,metastability immune warning flip-flop,process variation,size 65 nm,voltage 0.72 V to 1.15 V,warning detector,warning window generator,Clocks,Delays,Detectors,Image edge detection,Inverters,Monitoring,Dynamic voltage scaling (D
Collections
:
-
Statistics
Frequency-Independent Warning Detection Sequential for Dynamic Voltage and Frequency Scaling in ASICs
Show full item record
| contributor author | Das, Bishnu Prasad | |
| contributor author | Onodera, Hidetoshi | |
| date accessioned | 2020-03-12T18:41:24Z | |
| date available | 2020-03-12T18:41:24Z | |
| date issued | 2014 | |
| identifier issn | 1063-8210 | |
| identifier other | 6716073.pdf | |
| identifier uri | http://libsearch.um.ac.ir:80/fum/handle/fum/966963?locale-attribute=en | |
| format | general | |
| language | English | |
| publisher | IEEE | |
| title | Frequency-Independent Warning Detection Sequential for Dynamic Voltage and Frequency Scaling in ASICs | |
| type | Journal Paper | |
| contenttype | Metadata Only | |
| identifier padid | 8000873 | |
| subject keywords | application specific integrated circuits | |
| subject keywords | flip-flops | |
| subject keywords | integrated circuit design | |
| subject keywords | integrated circuit reliability | |
| subject keywords | low-power electronics | |
| subject keywords | ASIC | |
| subject keywords | Kogge stone adder | |
| subject keywords | dynamic voltage scaling | |
| subject keywords | edge detector | |
| subject keywords | frequency independent warning detection | |
| subject keywords | frequency scaling | |
| subject keywords | metastability immune warning flip-flop | |
| subject keywords | process variation | |
| subject keywords | size 65 nm | |
| subject keywords | voltage 0.72 V to 1.15 V | |
| subject keywords | warning detector | |
| subject keywords | warning window generator | |
| subject keywords | Clocks | |
| subject keywords | Delays | |
| subject keywords | Detectors | |
| subject keywords | Image edge detection | |
| subject keywords | Inverters | |
| subject keywords | Monitoring | |
| subject keywords | Dynamic voltage scaling (D | |
| identifier doi | 10.1109/TVLSI.2013.2296033 | |
| journal title | Very Large Scale Integration (VLSI) Systems, IEEE Transactions on | |
| journal volume | 22 | |
| journal issue | 12 | |
| filesize | 2249768 | |
| citations | 0 |