Single-Error-Correction and Double-Adjacent-Error-Correction Code for Simultaneous Testing of Data Bit and Check Bit Arrays in Memories
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سال
: 2014شناسه الکترونیک: 10.1109/TDMR.2014.2299595
کلیدواژه(گان): error correction codes,memory architecture,radiation hardening (electronics),testing,SEC DAEC code,check bit arrays,data bit arrays,double adjacent error correction code,interword coupling faults,intraword coupling faults,memory array tests,memory fault models,simultaneous testing,single cell faults,single error correction code,Arrays,Error correction codes,Generators,Hardware,Materials reliability,Testing,Vectors,Error correction code,fault model,memory test,word-orient
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آمار بازدید
Single-Error-Correction and Double-Adjacent-Error-Correction Code for Simultaneous Testing of Data Bit and Check Bit Arrays in Memories
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| contributor author | Sanguhn Cha | |
| contributor author | Hongil Yoon | |
| date accessioned | 2020-03-12T18:40:01Z | |
| date available | 2020-03-12T18:40:01Z | |
| date issued | 2014 | |
| identifier issn | 1530-4388 | |
| identifier other | 6709746.pdf | |
| identifier uri | http://libsearch.um.ac.ir:80/fum/handle/fum/966161 | |
| format | general | |
| language | English | |
| publisher | IEEE | |
| title | Single-Error-Correction and Double-Adjacent-Error-Correction Code for Simultaneous Testing of Data Bit and Check Bit Arrays in Memories | |
| type | Journal Paper | |
| contenttype | Metadata Only | |
| identifier padid | 7999934 | |
| subject keywords | error correction codes | |
| subject keywords | memory architecture | |
| subject keywords | radiation hardening (electronics) | |
| subject keywords | testing | |
| subject keywords | SEC DAEC code | |
| subject keywords | check bit arrays | |
| subject keywords | data bit arrays | |
| subject keywords | double adjacent error correction code | |
| subject keywords | interword coupling faults | |
| subject keywords | intraword coupling faults | |
| subject keywords | memory array tests | |
| subject keywords | memory fault models | |
| subject keywords | simultaneous testing | |
| subject keywords | single cell faults | |
| subject keywords | single error correction code | |
| subject keywords | Arrays | |
| subject keywords | Error correction codes | |
| subject keywords | Generators | |
| subject keywords | Hardware | |
| subject keywords | Materials reliability | |
| subject keywords | Testing | |
| subject keywords | Vectors | |
| subject keywords | Error correction code | |
| subject keywords | fault model | |
| subject keywords | memory test | |
| subject keywords | word-orient | |
| identifier doi | 10.1109/TDMR.2014.2299595 | |
| journal title | Device and Materials Reliability, IEEE Transactions on | |
| journal volume | 14 | |
| journal issue | 1 | |
| filesize | 260599 | |
| citations | 0 |