Show simple item record

Novel Defects-Trapping <formula formulatype="inline"> <img src="/images/tex/21375.gif" alt="{\\rm TaO}_{\\rm X}/{\\rm HfO}_{\\rm X}"> </formula> RRAM With Reliable Self-Compliance, High Nonlinearity, and Ultra-Low Current

contributor authorYu-Sheng Chen
contributor authorHeng-Yuan Lee
contributor authorPang-Shiu Chen
contributor authorWei-Su Chen
contributor authorKan-Hsueh Tsai
contributor authorPei-Yi Gu
contributor authorTai-Yuan Wu
contributor authorChen-Han Tsai
contributor authorRahaman, S.Z.
contributor authorYu-De Lin
contributor authorChen, Fan
contributor authorMing-Jinn Tsai
contributor authorTzu-Kun Ku
date accessioned2020-03-12T18:36:52Z
date available2020-03-12T18:36:52Z
date issued2014
identifier issn0741-3106
identifier other6689291.pdf
identifier urihttp://libsearch.um.ac.ir:80/fum/handle/fum/964398?locale-attribute=fa&show=full
formatgeneral
languageEnglish
publisherIEEE
titleNovel Defects-Trapping <formula formulatype="inline"> <img src="/images/tex/21375.gif" alt="{\\rm TaO}_{\\rm X}/{\\rm HfO}_{\\rm X}"> </formula> RRAM With Reliable Self-Compliance, High Nonlinearity, and Ultra-Low Current
typeJournal Paper
contenttypeMetadata Only
identifier padid7997882
subject keywordscurrent density
subject keywordshafnium compounds
subject keywordsrandom-access storage
subject keywordstantalum compounds
subject keywordsTa-TaO<
subject keywordssub>
subject keywordsX<
subject keywords/sub>
subject keywords-HfO<
subject keywordssub>
subject keywordsX<
subject keywords/sub>
subject keywordscell size
subject keywordsconstant current density switching
subject keywordsdefects-trapping RRAM
subject keywordsdefects-trapping mechanism
subject keywordsdefects-trapping transport
subject keywordsdevice initial state
subject keywordsgeneral filamentary
subject keywordsoperation current
subject keywordsstable resistive switching
subject keywordsswitching current reduction
subject keywordstransition metal oxide RRAM
subject keywordsultra-low current
subject keywordsvertical RRAM structure
subject keywordsArrays
subject keywordsHafnium compounds
subject keywordsMicroprocessors
identifier doi10.1109/LED.2013.2294375
journal titleElectron Device Letters, IEEE
journal volume35
journal issue2
filesize676047
citations0


Files in this item

FilesSizeFormatView

There are no files associated with this item.

This item appears in the following Collection(s)

Show simple item record