A Constrained Layout Placement Approach to Enhance Pulse Quenching Effect in Large Combinational Circuits
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Year
: 2014DOI: 10.1109/TDMR.2013.2291409
Keyword(s): combinational circuits,integrated circuit layout,radiation hardening (electronics),radiation quenching,combinational circuits,constrained layout placement,pulse quenching effect,quenching cells,soft error vulnerability,Combinational circuits,Ions,Layout,Logic gates,MOSFET,Standards,Vectors,Constrained layout,multi-node charge collection,pulse quenching effect,quenching cells
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A Constrained Layout Placement Approach to Enhance Pulse Quenching Effect in Large Combinational Circuits
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| contributor author | Yankang Du | |
| contributor author | Shuming Chen | |
| contributor author | Biwei Liu | |
| date accessioned | 2020-03-12T18:33:21Z | |
| date available | 2020-03-12T18:33:21Z | |
| date issued | 2014 | |
| identifier issn | 1530-4388 | |
| identifier other | 6670093.pdf | |
| identifier uri | http://libsearch.um.ac.ir:80/fum/handle/fum/962390?locale-attribute=en | |
| format | general | |
| language | English | |
| publisher | IEEE | |
| title | A Constrained Layout Placement Approach to Enhance Pulse Quenching Effect in Large Combinational Circuits | |
| type | Journal Paper | |
| contenttype | Metadata Only | |
| identifier padid | 7995385 | |
| subject keywords | combinational circuits | |
| subject keywords | integrated circuit layout | |
| subject keywords | radiation hardening (electronics) | |
| subject keywords | radiation quenching | |
| subject keywords | combinational circuits | |
| subject keywords | constrained layout placement | |
| subject keywords | pulse quenching effect | |
| subject keywords | quenching cells | |
| subject keywords | soft error vulnerability | |
| subject keywords | Combinational circuits | |
| subject keywords | Ions | |
| subject keywords | Layout | |
| subject keywords | Logic gates | |
| subject keywords | MOSFET | |
| subject keywords | Standards | |
| subject keywords | Vectors | |
| subject keywords | Constrained layout | |
| subject keywords | multi-node charge collection | |
| subject keywords | pulse quenching effect | |
| subject keywords | quenching cells | |
| identifier doi | 10.1109/TDMR.2013.2291409 | |
| journal title | Device and Materials Reliability, IEEE Transactions on | |
| journal volume | 14 | |
| journal issue | 1 | |
| filesize | 1606292 | |
| citations | 0 |