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Influence of AlN Thin Film as Thermal Interface Material on Thermal and Optical Properties of High-Power LED

Author:
Subramani, Siva
,
Devarajan, Mutharasu
Publisher:
IEEE
Year
: 2014
DOI: 10.1109/TDMR.2013.2285112
URI: http://libsearch.um.ac.ir:80/fum/handle/fum/960421
Keyword(s): III-V semiconductors,aluminium,aluminium compounds,heat sinks,light emitting diodes,semiconductor thin films,semiconductor-metal boundaries,thermal resistance,wide band gap semiconductors,Al,Al substrates,AlN thin film,AlN-Al,color rendering index,correlated color temperature,dual interface method,green LED,heat sink,high-power light-emitting diode application,junction temperature,luminosity,optical properties,peak wavelength,power 3 W,thermal interface material,thermal
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    Influence of AlN Thin Film as Thermal Interface Material on Thermal and Optical Properties of High-Power LED

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contributor authorSubramani, Siva
contributor authorDevarajan, Mutharasu
date accessioned2020-03-12T18:29:44Z
date available2020-03-12T18:29:44Z
date issued2014
identifier issn1530-4388
identifier other6626639.pdf
identifier urihttp://libsearch.um.ac.ir:80/fum/handle/fum/960421
formatgeneral
languageEnglish
publisherIEEE
titleInfluence of AlN Thin Film as Thermal Interface Material on Thermal and Optical Properties of High-Power LED
typeJournal Paper
contenttypeMetadata Only
identifier padid7993091
subject keywordsIII-V semiconductors
subject keywordsaluminium
subject keywordsaluminium compounds
subject keywordsheat sinks
subject keywordslight emitting diodes
subject keywordssemiconductor thin films
subject keywordssemiconductor-metal boundaries
subject keywordsthermal resistance
subject keywordswide band gap semiconductors
subject keywordsAl
subject keywordsAl substrates
subject keywordsAlN thin film
subject keywordsAlN-Al
subject keywordscolor rendering index
subject keywordscorrelated color temperature
subject keywordsdual interface method
subject keywordsgreen LED
subject keywordsheat sink
subject keywordshigh-power light-emitting diode application
subject keywordsjunction temperature
subject keywordsluminosity
subject keywordsoptical properties
subject keywordspeak wavelength
subject keywordspower 3 W
subject keywordsthermal interface material
subject keywordsthermal
identifier doi10.1109/TDMR.2013.2285112
journal titleDevice and Materials Reliability, IEEE Transactions on
journal volume14
journal issue1
filesize795784
citations0
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