Rugged Electrical Power Switching in Semiconductors: A Systems Approach
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: 2014DOI: 10.1109/JPROC.2013.2278616
Keyword(s): III-V semiconductors,computer power supplies,gallium compounds,leakage currents,power MOSFET,semiconductor device reliability,silicon compounds,telecommunication power supplies,wide band gap semiconductors,GaN,SEB stress testing methodology,SiC,WBG semiconductor power devices,compact computer-telecom power supplies,field reliability,high-density power supplies,local microplasma,long-term repetitive field-switching conditions,low-level leakage currents,market penetration,power
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Rugged Electrical Power Switching in Semiconductors: A Systems Approach
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| contributor author | Shenai, Krishna | |
| contributor author | Dudley, Michael | |
| contributor author | Davis, R.F. | |
| date accessioned | 2020-03-12T18:27:50Z | |
| date available | 2020-03-12T18:27:50Z | |
| date issued | 2014 | |
| identifier issn | 0018-9219 | |
| identifier other | 6595555.pdf | |
| identifier uri | http://libsearch.um.ac.ir:80/fum/handle/fum/959356 | |
| format | general | |
| language | English | |
| publisher | IEEE | |
| title | Rugged Electrical Power Switching in Semiconductors: A Systems Approach | |
| type | Journal Paper | |
| contenttype | Metadata Only | |
| identifier padid | 7991915 | |
| subject keywords | III-V semiconductors | |
| subject keywords | computer power supplies | |
| subject keywords | gallium compounds | |
| subject keywords | leakage currents | |
| subject keywords | power MOSFET | |
| subject keywords | semiconductor device reliability | |
| subject keywords | silicon compounds | |
| subject keywords | telecommunication power supplies | |
| subject keywords | wide band gap semiconductors | |
| subject keywords | GaN | |
| subject keywords | SEB stress testing methodology | |
| subject keywords | SiC | |
| subject keywords | WBG semiconductor power devices | |
| subject keywords | compact computer-telecom power supplies | |
| subject keywords | field reliability | |
| subject keywords | high-density power supplies | |
| subject keywords | local microplasma | |
| subject keywords | long-term repetitive field-switching conditions | |
| subject keywords | low-level leakage currents | |
| subject keywords | market penetration | |
| subject keywords | power | |
| identifier doi | 10.1109/JPROC.2013.2278616 | |
| journal title | Proceedings of the IEEE | |
| journal volume | 102 | |
| journal issue | 1 | |
| filesize | 1355755 | |
| citations | 0 |