Built-In EVM Measurement With Negligible Hardware Overhead
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Year
: 2014DOI: 10.1109/MDAT.2013.2265164
Keyword(s): built-in self test,error analysis,test equipment,all-digital method,built-in EVM measurement,error vector magnitude,negligible hardware overhead,sophisticated external test equipment,test application time,Discrete Fourier transforms,Error correction,OFDM,Radio frequency,Receivers,Transmitters,Vectors
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Built-In EVM Measurement With Negligible Hardware Overhead
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| contributor author | Yilmaz, Ender | |
| contributor author | Nassery, Afsaneh | |
| contributor author | Ozev, Sule | |
| date accessioned | 2020-03-12T18:23:49Z | |
| date available | 2020-03-12T18:23:49Z | |
| date issued | 2014 | |
| identifier issn | 2168-2356 | |
| identifier other | 6522140.pdf | |
| identifier uri | http://libsearch.um.ac.ir:80/fum/handle/fum/957078?locale-attribute=en | |
| format | general | |
| language | English | |
| publisher | IEEE | |
| title | Built-In EVM Measurement With Negligible Hardware Overhead | |
| type | Journal Paper | |
| contenttype | Metadata Only | |
| identifier padid | 7989253 | |
| subject keywords | built-in self test | |
| subject keywords | error analysis | |
| subject keywords | test equipment | |
| subject keywords | all-digital method | |
| subject keywords | built-in EVM measurement | |
| subject keywords | error vector magnitude | |
| subject keywords | negligible hardware overhead | |
| subject keywords | sophisticated external test equipment | |
| subject keywords | test application time | |
| subject keywords | Discrete Fourier transforms | |
| subject keywords | Error correction | |
| subject keywords | OFDM | |
| subject keywords | Radio frequency | |
| subject keywords | Receivers | |
| subject keywords | Transmitters | |
| subject keywords | Vectors | |
| identifier doi | 10.1109/MDAT.2013.2265164 | |
| journal title | Design & Test, IEEE | |
| journal volume | 31 | |
| journal issue | 1 | |
| filesize | 483642 | |
| citations | 0 |