Examining Timing Path Robustness Under Wide-Bandwidth Power Supply Noise Through Multi-Functional-Cycle Delay Test
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: 2014شناسه الکترونیک: 10.1109/TVLSI.2013.2256810
کلیدواژه(گان): automatic test pattern generation,integrated circuit noise,integrated circuit reliability,integrated circuit testing,nanoelectronics,power supply circuits,SPICE-accurate estimation,at-speed functional cycles,at-speed testing techniques,circuit layout,circuit robustness,circuit timing,compound noise profile,delay testing schemes,linear superposition,low-frequency noise,marginal timing failures,middle-frequency noise,multifunctional-cycle delay test,multifunctional-cycle test sc
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Examining Timing Path Robustness Under Wide-Bandwidth Power Supply Noise Through Multi-Functional-Cycle Delay Test
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| contributor author | Mingjing Chen | |
| contributor author | Orailoglu, A. | |
| date accessioned | 2020-03-12T18:23:23Z | |
| date available | 2020-03-12T18:23:23Z | |
| date issued | 2014 | |
| identifier issn | 1063-8210 | |
| identifier other | 6515389.pdf | |
| identifier uri | http://libsearch.um.ac.ir:80/fum/handle/fum/956836?locale-attribute=fa | |
| format | general | |
| language | English | |
| publisher | IEEE | |
| title | Examining Timing Path Robustness Under Wide-Bandwidth Power Supply Noise Through Multi-Functional-Cycle Delay Test | |
| type | Journal Paper | |
| contenttype | Metadata Only | |
| identifier padid | 7988970 | |
| subject keywords | automatic test pattern generation | |
| subject keywords | integrated circuit noise | |
| subject keywords | integrated circuit reliability | |
| subject keywords | integrated circuit testing | |
| subject keywords | nanoelectronics | |
| subject keywords | power supply circuits | |
| subject keywords | SPICE-accurate estimation | |
| subject keywords | at-speed functional cycles | |
| subject keywords | at-speed testing techniques | |
| subject keywords | circuit layout | |
| subject keywords | circuit robustness | |
| subject keywords | circuit timing | |
| subject keywords | compound noise profile | |
| subject keywords | delay testing schemes | |
| subject keywords | linear superposition | |
| subject keywords | low-frequency noise | |
| subject keywords | marginal timing failures | |
| subject keywords | middle-frequency noise | |
| subject keywords | multifunctional-cycle delay test | |
| subject keywords | multifunctional-cycle test sc | |
| identifier doi | 10.1109/TVLSI.2013.2256810 | |
| journal title | Very Large Scale Integration (VLSI) Systems, IEEE Transactions on | |
| journal volume | 22 | |
| journal issue | 4 | |
| filesize | 2132797 | |
| citations | 0 |