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On the MOSFET Threshold Voltage Extraction by Transconductance and Transconductance-to-Current Ratio Change Methods: Part I—Effect of Gate-Voltage-Dependent Mobility

Author:
Rudenko, T.
,
Kilchytska, V.
,
Arshad, M.K.M.
,
Raskin, J.-P.
,
Nazarov, A.
,
Flandre, D.
Publisher:
IEEE
Year
: 2011
DOI: 10.1109/ted.2011.2168226
URI: http://libsearch.um.ac.ir:80/fum/handle/fum/558587
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    On the MOSFET Threshold Voltage Extraction by Transconductance and Transconductance-to-Current Ratio Change Methods: Part I—Effect of Gate-Voltage-Dependent Mobility

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contributor authorRudenko, T.
contributor authorKilchytska, V.
contributor authorArshad, M.K.M.
contributor authorRaskin, J.-P.
contributor authorNazarov, A.
contributor authorFlandre, D.
date accessioned2020-03-11T14:20:38Z
date available2020-03-11T14:20:38Z
date issued2011
identifier otherIwcMGfe53YX8E5KKEENLHOPMfBEIyCe3eiROIx8YCCzeAqO_Er.pdf
identifier urihttp://libsearch.um.ac.ir:80/fum/handle/fum/558587?locale-attribute=en
formatgeneral
languageEnglish
publisherIEEE
titleOn the MOSFET Threshold Voltage Extraction by Transconductance and Transconductance-to-Current Ratio Change Methods: Part I—Effect of Gate-Voltage-Dependent Mobility
typeJournal Paper
contenttypeFulltext
contenttypeFulltext
identifier padid4353415
identifier doi10.1109/ted.2011.2168226
journal titleIEEE Transactions on Electron Devices
coverageAcademic
pages4172-4179
journal volume58
journal issue12
filesize574766
citations6
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