Two effective methods to mitigate soft error effects in SRAM-based FPGAs
| contributor author | Alireza Rohani | |
| contributor author | Hamid R. Zarandi | |
| date accessioned | 2020-03-11T08:22:05Z | |
| date available | 2020-03-11T08:22:05Z | |
| date issued | 2010 | |
| identifier other | PoZ4iYMHa3JvFZP72aH_7uiHZh_INmCoRKleXKPczgeHTJSItF.pdf | |
| identifier uri | http://libsearch.um.ac.ir:80/fum/handle/fum/469684?locale-attribute=en&show=full | |
| format | general | |
| language | English | |
| publisher | Elsevier Science | |
| title | Two effective methods to mitigate soft error effects in SRAM-based FPGAs | |
| type | Journal Paper | |
| contenttype | Fulltext | |
| contenttype | Fulltext | |
| identifier padid | 4000936 | |
| identifier doi | 10.1016/j.microrel.2010.04.021 | |
| journal title | Microelectronics Reliability | |
| coverage | Academic | |
| pages | 1171-1180 | |
| journal volume | 50 | |
| journal issue | 8 | |
| filesize | 797866 | |
| citations | 1 |