Reliability concerns in embedded system designs
Year
: 2006DOI: 10.1109/mc.2006.31
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Reliability concerns in embedded system designs
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| contributor author | Narayanan, V. | |
| contributor author | Xie, Y. | |
| date accessioned | 2020-03-16T07:13:37Z | |
| date available | 2020-03-16T07:13:37Z | |
| date issued | 2006 | |
| identifier other | Tk2RSPL79l4T7vrROO6fRzHLLAA1WFPmaogpAK2xtRkK5yvaNo.pdf | |
| identifier uri | http://libsearch.um.ac.ir:80/fum/handle/fum/2213842 | |
| format | general | |
| language | English | |
| title | Reliability concerns in embedded system designs | |
| type | Journal Paper | |
| contenttype | Fulltext | |
| contenttype | Fulltext | |
| identifier padid | 14907804 | |
| identifier doi | 10.1109/mc.2006.31 | |
| coverage | Academic | |
| pages | 118-120 | |
| journal volume | 39 | |
| journal issue | 1 | |
| filesize | 770400 | |
| citations | 4 |