A Method of Test Case Automatic Generation for Embedded Software
سال
: 2009شناسه الکترونیک: 10.1109/ICIECS.2009.5363631
کالکشن
:
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آمار بازدید
A Method of Test Case Automatic Generation for Embedded Software
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| contributor author | Yongfeng Yin | |
| contributor author | Bin Liu | |
| date accessioned | 2020-03-14T13:15:35Z | |
| date available | 2020-03-14T13:15:35Z | |
| date issued | 2009 | |
| identifier other | 55zK0DxZQuc9RT6w_jNSiiJcVRYcTQNNasxiPVo9YKwQEhyzTB.pdf | |
| identifier uri | http://libsearch.um.ac.ir:80/fum/handle/fum/1655131 | |
| format | general | |
| language | English | |
| title | A Method of Test Case Automatic Generation for Embedded Software | |
| type | Journal Paper | |
| contenttype | Fulltext | |
| contenttype | Fulltext | |
| identifier padid | 11892245 | |
| identifier doi | 10.1109/ICIECS.2009.5363631 | |
| journal title | 2009 International Conference on Information Engineering and Computer Science | |
| coverage | Academic | |
| filesize | 145900 | |
| citations | 3 |