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[IEEE Design, Automation & Test in Europe Conference - Nice, France (2007.04.16-2007.04.20)] 2007 Design, Automation & Test in Europe Conference & Exhibition - Statistical Blockade: A Novel Method for Very Fast Monte Carlo Simulation of Rare Circuit Events, and its Application

contributor authorSinghee, Amith
contributor authorRutenbar, Rob A.
date accessioned2020-03-13T12:44:08Z
date available2020-03-13T12:44:08Z
date issued2007
identifier otherBRzLJm_Pkl8iGH75XOR2GuOFaDgQWAzRMzrIZqQu29QYClI1T9.pdf
identifier urihttp://libsearch.um.ac.ir:80/fum/handle/fum/1312471?locale-attribute=en&show=full
formatgeneral
languageEnglish
title[IEEE Design, Automation & Test in Europe Conference - Nice, France (2007.04.16-2007.04.20)] 2007 Design, Automation & Test in Europe Conference & Exhibition - Statistical Blockade: A Novel Method for Very Fast Monte Carlo Simulation of Rare Circuit Events, and its Application
typeJournal Paper
contenttypeFulltext
contenttypeFulltext
identifier padid9754664
identifier doi10.1109/DATE.2007.364490
coverageAcademic
pages1-6
filesize341379
citations1


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