Study of Excess Noise Factor Under Nonlocal Effect in Avalanche Photodiodes
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Year
: 2014DOI: 10.1109/LPT.2014.2348914
Keyword(s): Avalanche photodiodes,Impact ionization,Monte Carlo methods,Noise,Avalanche photodiode,Monte Carlo simulation,excess noise factor,impact ionization
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Study of Excess Noise Factor Under Nonlocal Effect in Avalanche Photodiodes
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| contributor author | Sun, Wen | |
| contributor author | Zheng, Xiaoquan | |
| contributor author | Campbell, Joe C. | |
| date accessioned | 2020-03-13T00:18:50Z | |
| date available | 2020-03-13T00:18:50Z | |
| date issued | 2014 | |
| identifier issn | 1041-1135 | |
| identifier other | 6879478.pdf | |
| identifier uri | http://libsearch.um.ac.ir:80/fum/handle/fum/1142113?locale-attribute=en | |
| format | general | |
| language | English | |
| publisher | IEEE | |
| title | Study of Excess Noise Factor Under Nonlocal Effect in Avalanche Photodiodes | |
| type | Journal Paper | |
| contenttype | Metadata Only | |
| identifier padid | 8324603 | |
| subject keywords | Avalanche photodiodes | |
| subject keywords | Impact ionization | |
| subject keywords | Monte Carlo methods | |
| subject keywords | Noise | |
| subject keywords | Avalanche photodiode | |
| subject keywords | Monte Carlo simulation | |
| subject keywords | excess noise factor | |
| subject keywords | impact ionization | |
| identifier doi | 10.1109/LPT.2014.2348914 | |
| journal title | Photonics Technology Letters, IEEE | |
| journal volume | 26 | |
| journal issue | 21 | |
| filesize | 778619 | |
| citations | 0 |