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Enhancement of radio frequency device's contact test using a novel method

Author:
Cheng-Nan Hu
,
Wen-Ju Chen
,
Hsuan-Chung Ko
Publisher:
IET
Year
: 2014
DOI: 10.1049/iet-smt.2013.0071
URI: http://libsearch.um.ac.ir:80/fum/handle/fum/1137825
Keyword(s): automatic test equipment,equivalent circuits,integrated circuit modelling,integrated circuit testing,prototypes,radiofrequency integrated circuits,RF device modelling,automatic test equipment,electric contact verification,equivalent circuit,prototype design,radio frequency devices,radio frequency traces
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    Enhancement of radio frequency device's contact test using a novel method

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contributor authorCheng-Nan Hu
contributor authorWen-Ju Chen
contributor authorHsuan-Chung Ko
date accessioned2020-03-13T00:11:46Z
date available2020-03-13T00:11:46Z
date issued2014
identifier issn1751-8822
identifier other6847042.pdf
identifier urihttp://libsearch.um.ac.ir:80/fum/handle/fum/1137825?locale-attribute=en
formatgeneral
languageEnglish
publisherIET
titleEnhancement of radio frequency device's contact test using a novel method
typeJournal Paper
contenttypeMetadata Only
identifier padid8319797
subject keywordsautomatic test equipment
subject keywordsequivalent circuits
subject keywordsintegrated circuit modelling
subject keywordsintegrated circuit testing
subject keywordsprototypes
subject keywordsradiofrequency integrated circuits
subject keywordsRF device modelling
subject keywordsautomatic test equipment
subject keywordselectric contact verification
subject keywordsequivalent circuit
subject keywordsprototype design
subject keywordsradio frequency devices
subject keywordsradio frequency traces
identifier doi10.1049/iet-smt.2013.0071
journal titleScience, Measurement & Technology, IET
journal volume8
journal issue4
filesize964011
citations0
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