Long-Term Effects of Relative Humidity on the Performance of ZnO-Based MEMS Acoustic Sensors
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سال
: 2014شناسه الکترونیک: 10.1109/TDMR.2014.2317415
کلیدواژه(گان): etching,micromachining,microsensors,passivation,plasma CVD,Al,MEMS acoustic sensors,PECVD layer,PECVD silicon dioxide,Si,ZnO,acoustic sensor chip,aluminum electrodes,bulk micromachining technique,dissipation factor,etching,fabrication process,frequency response,humid environment conditions,passivating layer,relative humidity,sensitivity response,silicon diaphragm,size 0.3 mum,size 25 mum,weak acid,Acoustic measurements,Acoustic sensors,Capacitance,Etching,Humidity
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Long-Term Effects of Relative Humidity on the Performance of ZnO-Based MEMS Acoustic Sensors
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contributor author | Prasad, M. | |
contributor author | Sahula, Vineet | |
contributor author | Khanna, Vinod Kumar | |
date accessioned | 2020-03-12T23:58:26Z | |
date available | 2020-03-12T23:58:26Z | |
date issued | 2014 | |
identifier issn | 1530-4388 | |
identifier other | 6798753.pdf | |
identifier uri | http://libsearch.um.ac.ir:80/fum/handle/fum/1129957 | |
format | general | |
language | English | |
publisher | IEEE | |
title | Long-Term Effects of Relative Humidity on the Performance of ZnO-Based MEMS Acoustic Sensors | |
type | Journal Paper | |
contenttype | Metadata Only | |
identifier padid | 8310381 | |
subject keywords | etching | |
subject keywords | micromachining | |
subject keywords | microsensors | |
subject keywords | passivation | |
subject keywords | plasma CVD | |
subject keywords | Al | |
subject keywords | MEMS acoustic sensors | |
subject keywords | PECVD layer | |
subject keywords | PECVD silicon dioxide | |
subject keywords | Si | |
subject keywords | ZnO | |
subject keywords | acoustic sensor chip | |
subject keywords | aluminum electrodes | |
subject keywords | bulk micromachining technique | |
subject keywords | dissipation factor | |
subject keywords | etching | |
subject keywords | fabrication process | |
subject keywords | frequency response | |
subject keywords | humid environment conditions | |
subject keywords | passivating layer | |
subject keywords | relative humidity | |
subject keywords | sensitivity response | |
subject keywords | silicon diaphragm | |
subject keywords | size 0.3 mum | |
subject keywords | size 25 mum | |
subject keywords | weak acid | |
subject keywords | Acoustic measurements | |
subject keywords | Acoustic sensors | |
subject keywords | Capacitance | |
subject keywords | Etching | |
subject keywords | Humidity | |
identifier doi | 10.1109/TDMR.2014.2317415 | |
journal title | Device and Materials Reliability, IEEE Transactions on | |
journal volume | 14 | |
journal issue | 2 | |
filesize | 544761 | |
citations | 0 |