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Measurement of the Intrinsic Parameters of Single-Mode VCSELs

contributor authorPerez, Pablo
contributor authorValle, Angel
contributor authorNoriega, Ignacio
contributor authorPesquera, Luis
date accessioned2020-03-12T23:48:29Z
date available2020-03-12T23:48:29Z
date issued2014
identifier issn0733-8724
identifier other6747990.pdf
identifier urihttp://libsearch.um.ac.ir:80/fum/handle/fum/1124065?locale-attribute=en&show=full
formatgeneral
languageEnglish
publisherIEEE
titleMeasurement of the Intrinsic Parameters of Single-Mode VCSELs
typeJournal Paper
contenttypeMetadata Only
identifier padid8303581
subject keywordscarrier lifetime
subject keywordslaser cavity resonators
subject keywordslaser modes
subject keywordslaser noise
subject keywordslaser variables measurement
subject keywordssemiconductor lasers
subject keywordssurface emitting lasers
subject keywordsIntensity noise spectrum analysis
subject keywordsbias current
subject keywordsdifferential carrier lifetime
subject keywordshigh resolution CW optical spectrum measurements
subject keywordsintrinsic parameter measurement
subject keywordslaser linewidth
subject keywordslaser power
subject keywordslong-wavelength vertical-cavity surface-emitting laser
subject keywordsparameter extraction
subject keywordssemiconductor laser rate equations
subject keywordssingle-transverse mode VCSEL
subject keywordswavelength 1550 nm
identifier doi10.1109/JLT.2014.2308303
journal titleLightwave Technology, Journal of
journal volume32
journal issue8
filesize416239
citations0


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