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Non-destructive crack and defect detection in SAC solder interconnects using cross-sectioning and X-ray micro-CT

Author:
Lall, P. , Deshpande, S. , Junchao Wei , Suhling, J.
Publisher:
IEEE
Year
: 2014
DOI: 10.1109/SMC.2014.6974442
URI: http://libsearch.um.ac.ir:80/fum/handle/fum/1115300
Keyword(s): Computer aided instruction,Hospitals,Mobile handsets,Professional activities,Software,communication process,e-health,natural interaction,nomadic workers
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    Non-destructive crack and defect detection in SAC solder interconnects using cross-sectioning and X-ray micro-CT

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date accessioned2020-03-12T23:32:24Z
date available2020-03-12T23:32:24Z
date issued2014
identifier other6897484.pdf
identifier urihttp://libsearch.um.ac.ir:80/fum/handle/fum/1115300?locale-attribute=en
formatgeneral
languageEnglish
publisherIEEE
titleNon-destructive crack and defect detection in SAC solder interconnects using cross-sectioning and X-ray micro-CT
typeConference Paper
contenttypeMetadata Only
identifier padid8284720
subject keywordsComputer aided instruction
subject keywordsHospitals
subject keywordsMobile handsets
subject keywordsProfessional activities
subject keywordsSoftware
subject keywordscommunication process
subject keywordse-health
subject keywordsnatural interaction
subject keywordsnomadic workers
identifier doi10.1109/SMC.2014.6974442
journal titlelectronic Components and Technology Conference (ECTC), 2014 IEEE 64th
filesize2826247
citations0
contributor rawauthorLall, P. , Deshpande, S. , Junchao Wei , Suhling, J.
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